by Gerling, W. H., Preussger, A., Wulfert, F. W.
Published in Quality and reliability engineering international (01.03.2002)

by Faissner, H., Frenzel, E., Heinrigs, W., Preussger, A., Samm, D., Samm, U.
Published in Physics letters. B (01.01.1980)

by Preussger, A., Glenz, E., Heift, K., Malek, K., Schwetlick, W., Wiesinger, K., Werner, W.M.
Published in [1991] Proceedings of the 3rd International Symposium on Power Semiconductor Devices and ICs (1991)

Published in Quality and reliability engineering international (01.03.2002)

by Preussger, A., Kanert, W., Gerling, W.
Published in 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual (2003)

by Martin, Andreas, Kerber, Martin, Preussger, Andreas
Published in Microelectronics and reliability (01.04.2000)

by Diestel, Gunnar, Martin, Andreas, Kerber, Martin, Schlemm, Alfred, Erlenmaier, Horst, Murr, Bernhard, Preussger, Andreas
Published in Microelectronics and reliability (01.07.2001)

by Wylie, I., Preussger, A.
Published in 1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319) (1997)

by Faissner, H., Frenzel, E., Heinrigs, W., Preussger, A., Samm, D., Samm, U.
Published in Physics letters. B (23.07.1981)

by Papp, A., Bieringer, F., Koch, D., Kammer, H., Kohlhase, A., Lill, A., Preussger, A., Schlemm, A., Schneegans, M.
Published in IEEE 1995 International Integrated Reliability Workshop. Final Report (1995)