Limit on axion decay into an electron pair
Faissner, H., Frenzel, E., Heinrigs, W., Preussger, A., Samm, D., Samm, U.
Published in Physics letters. B (01.01.1980)
Published in Physics letters. B (01.01.1980)
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Journal Article
SPT-a new smart power technology with a fully self aligned DMOS cell
Preussger, A., Glenz, E., Heift, K., Malek, K., Schwetlick, W., Wiesinger, K., Werner, W.M.
Published in [1991] Proceedings of the 3rd International Symposium on Power Semiconductor Devices and ICs (1991)
Published in [1991] Proceedings of the 3rd International Symposium on Power Semiconductor Devices and ICs (1991)
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Conference Proceeding
Editorial: Research in Industrial Statistics-Part II
Published in Quality and reliability engineering international
(01.03.2002)
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Journal Article
Reliability qualification of a smart power technology for high temperature application based on physics-of-failure and risk & opportunity assessment
Preussger, A., Kanert, W., Gerling, W.
Published in 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual (2003)
Published in 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual (2003)
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Conference Proceeding
Assessing oxide reliability targets with fast WLR measurements
Martin, Andreas, Kerber, Martin, Preussger, Andreas
Published in Microelectronics and reliability (01.04.2000)
Published in Microelectronics and reliability (01.04.2000)
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Journal Article
Discussion Group Summary Customer Reliability Requirements
Wylie, I., Preussger, A.
Published in 1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319) (1997)
Published in 1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319) (1997)
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Conference Proceeding
Observation of the two-photon decay of a light penetrating particle
Faissner, H., Frenzel, E., Heinrigs, W., Preussger, A., Samm, D., Samm, U.
Published in Physics letters. B (23.07.1981)
Published in Physics letters. B (23.07.1981)
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Journal Article
Implementation of a WLR-program into a production line
Papp, A., Bieringer, F., Koch, D., Kammer, H., Kohlhase, A., Lill, A., Preussger, A., Schlemm, A., Schneegans, M.
Published in IEEE 1995 International Integrated Reliability Workshop. Final Report (1995)
Published in IEEE 1995 International Integrated Reliability Workshop. Final Report (1995)
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Conference Proceeding