Characterization of Si in a W matrix Using Diffraction Contrast in the TEM
Prenitzer, B.I., Kempshall, B.W., McKinley, J.M., Stinebaugh, W.H., Wylie, I.
Published in Microscopy and microanalysis (01.08.2002)
Published in Microscopy and microanalysis (01.08.2002)
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