A comparison of gamma and proton radiation effects in 200 GHz SiGe HBTs
Sutton, A.K., Haugerud, B.M., Prakash, A.P.G., Bongim Jun, Cressler, J.D., Marshall, C.J., Marshall, P.W., Ladbury, R., Guarin, F., Joseph, A.J.
Published in IEEE transactions on nuclear science (01.12.2005)
Published in IEEE transactions on nuclear science (01.12.2005)
Get full text
Journal Article
An Exploration of Substrate Coupling at K-Band Between a SiGe HBT Power Amplifier and a SiGe HBT Voltage-Controlled-Oscillator
Comeau, J.P., Najafizadeh, L., Andrews, J.M., Prakash, A.P.G., Cressler, J.D.
Published in IEEE microwave and wireless components letters (01.05.2007)
Published in IEEE microwave and wireless components letters (01.05.2007)
Get full text
Journal Article
An Investigation of Dose Rate and Source Dependent Effects in 200 GHz SiGe HBTs
Sutton, A.K., Prakash, A.P.G., Bongim Jun, Enhai Zhao, Bellini, M., Pellish, J., Diestelhorst, R.M., Carts, M.A., Phan, A., Ladbury, R., Cressler, J.D., Marshall, Paul.W., Marshall, C.J., Reed, R.A., Schrimpf, R.D., Fleetwood, D.M.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
Get full text
Journal Article
The Effects of Irradiation Temperature on the Proton Response of SiGe HBTs
Prakash, A.P.G., Sutton, A.K., Diestelhorst, R.M., Espinel, G., Andrews, J., Bongim Jun, Cressler, J.D., Marshall, P.W., Marshall, C.J.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
Get full text
Journal Article
Temperature-Dependence of Off-State Drain Leakage in X-Ray Irradiated 130 nm CMOS Devices
Bongim Jun, Diestelhorst, R.M., Bellini, M., Espinel, G., Appaswamy, A., Prakash, A.P.G., Cressler, J.D., Dakai Chen, Schrimpf, R.D., Fleetwood, D.M., Turowski, M., Raman, A.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
Get full text
Journal Article
The impact of substrate bias on proton damage in 130 nm CMOS technology
Haugerud, B.M., Venkataraman, S., Sutton, A.K., Prakash, A.P.G., Cressler, J.D., Niu, G., Marshall, P.W., Joseph, A.J.
Published in IEEE Radiation Effects Data Workshop, 2005 (2005)
Published in IEEE Radiation Effects Data Workshop, 2005 (2005)
Get full text
Conference Proceeding