Reliability Qualification Challenges of SOCs in Advanced CMOS Process Nodes (Invited)
Liu, Shou-En, Li, Jian, Nayak, Deepak, Marathe, Amit, Balamukundhan, Kaushik, Gosavi, Vishal, Prajapati, Ajaykumar, Kilic, Baha, Pang, Mengzhi, Mittal, Arpit
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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