Analysis of the Single-Event Latch-Up Cross section of a 16 nm FinFET System-on-Chip Using Backside Single-Photon Absorption Laser Testing and Correlation With Heavy Ion Data
Fongral, M., Pouget, V., Saigne, F., Ruffenach, M., Carron, J., Malou, F., Mekki, J.
Published in IEEE transactions on nuclear science (01.08.2024)
Published in IEEE transactions on nuclear science (01.08.2024)
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Journal Article
Backside Laser Testing of Single-Event Effects in GaN-on-Si Power HEMTs
Ngom, C., Pouget, V., Zerarka, M., Coccetti, F., Touboul, A., Matmat, M., Crepel, O., Jonathas, S., Bascoul, G.
Published in IEEE transactions on nuclear science (01.08.2021)
Published in IEEE transactions on nuclear science (01.08.2021)
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Journal Article
Microprocessor Error Diagnosis by Trace Monitoring Under Laser Testing
Pena-Fernandez, M., Lindoso, A., Entrena, L., Lopes, I., Pouget, V.
Published in IEEE transactions on nuclear science (01.08.2021)
Published in IEEE transactions on nuclear science (01.08.2021)
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Journal Article
Bridging RHA Methodology From Component to System Level Applied to System-on-Modules
Da Costa Lopes, I., Pouget, V., Wrobel, F., Touboul, A., Saigne, F., Roed, K.
Published in IEEE transactions on nuclear science (01.07.2022)
Published in IEEE transactions on nuclear science (01.07.2022)
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Journal Article
Impact of Aging Degradation on Heavy-Ion SEU Response of 28-nm UTBB FD-SOI Technology
Mounir Mahmoud, M., Prinzie, J., Soderstrom, D., Niskanen, K., Pouget, V., Cathelin, A., Clerc, S., Leroux, P.
Published in IEEE transactions on nuclear science (01.08.2022)
Published in IEEE transactions on nuclear science (01.08.2022)
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Journal Article
Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET
Niskanen, K., Touboul, A. D., Germanicus, R. Coq, Michez, A., Javanainen, A., Wrobel, F., Boch, J., Pouget, V., Saigne, F.
Published in IEEE transactions on nuclear science (01.07.2020)
Published in IEEE transactions on nuclear science (01.07.2020)
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Journal Article
Analysis of SET Propagation in a System in Package Point of Load Converter
Rajkowski, T., Saigne, F., Pouget, V., Wrobel, F., Touboul, A., Boch, J., Kohler, P., Dubus, P., Wang, P. X.
Published in IEEE transactions on nuclear science (01.07.2020)
Published in IEEE transactions on nuclear science (01.07.2020)
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Journal Article
Exploiting Transistor Folding Layout as RHBD Technique Against Single-Event Transients
Aguiar, Y. Q., Wrobel, F., Autran, J.-L., Kastensmidt, F. L., Leroux, P., Saigne, F., Pouget, V., Touboul, A. D.
Published in IEEE transactions on nuclear science (01.07.2020)
Published in IEEE transactions on nuclear science (01.07.2020)
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Journal Article
Impact of Complex Logic Cell Layout on the Single-Event Transient Sensitivity
Aguiar, Y. Q., Wrobel, F., Autran, J.-L., Leroux, P., Saigne, F., Touboul, A. D., Pouget, V.
Published in IEEE transactions on nuclear science (01.07.2019)
Published in IEEE transactions on nuclear science (01.07.2019)
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Journal Article
Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses
Wrobel, F., Dilillo, L., Touboul, A. D., Pouget, V., Saigné, F.
Published in IEEE transactions on nuclear science (01.08.2014)
Published in IEEE transactions on nuclear science (01.08.2014)
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Journal Article
Design exploration of majority voter architectures based on the signal probability for TMR strategy optimization in space applications
Aguiar, Y.Q., Wrobel, F., Autran, J.-L., Leroux, P., Saigné, F., Pouget, V., Touboul, A.D.
Published in Microelectronics and reliability (01.11.2020)
Published in Microelectronics and reliability (01.11.2020)
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Journal Article
Reliability-driven pin assignment optimization to improve in-orbit soft-error rate
Aguiar, Y.Q., Wrobel, F., Autran, J.-L., Leroux, P., Saigné, F., Pouget, V., Touboul, A.D.
Published in Microelectronics and reliability (01.11.2020)
Published in Microelectronics and reliability (01.11.2020)
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Journal Article
Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter Chains
Cavrois, V.F., Pouget, V., McMorrow, D., Schwank, J.R., Fel, N., Essely, F., Flores, R.S., Paillet, P., Gaillardin, M., Kobayashi, D., Melinger, J.S., Duhamel, O., Dodd, P.E., Shaneyfelt, M.R.
Published in IEEE transactions on nuclear science (01.12.2008)
Published in IEEE transactions on nuclear science (01.12.2008)
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Journal Article
Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL
Buchner, S., Roche, N., Warner, J., McMorrow, D., Miller, F., Morand, S., Pouget, V., Larue, C., Ferlet-Cavrois, V., El Mamouni, F., Kettunen, H., Adell, P., Allen, G., Aveline, D.
Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Journal Article
3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing
Shao, K, Morisset, A, Pouget, V, Faraud, E, Larue, C, Lewis, D, McMorrow, D
Published in Optics express (07.11.2011)
Published in Optics express (07.11.2011)
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Journal Article
The Power Law Shape of Heavy Ions Experimental Cross Section
Wrobel, F., Touboul, A. D., Pouget, V., Dilillo, L., Lorfevre, E., Saigne, F.
Published in IEEE transactions on nuclear science (01.01.2017)
Published in IEEE transactions on nuclear science (01.01.2017)
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Journal Article
Investigation on the SEL Sensitive Depth of an SRAM Using Linear and Two-Photon Absorption Laser Testing
Faraud, E., Pouget, V., Shao, K., Larue, C., Darracq, F., Lewis, D., Samaras, A., Bezerra, F., Lorfevre, E., Ecoffet, R.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Characterization and modeling of laser-induced single-event burn-out in SiC power diodes
Mbaye, N., Pouget, V., Darracq, F., Lewis, D.
Published in Microelectronics and reliability (01.09.2013)
Published in Microelectronics and reliability (01.09.2013)
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Journal Article
Conference Proceeding
Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa
Wrobel, F., Touboul, A. D., Pouget, V., Dilillo, L., Ecoffet, R., Lorfevre, E., Bezerra, F., Brugger, M., Saigne, F.
Published in IEEE transactions on nuclear science (01.12.2014)
Published in IEEE transactions on nuclear science (01.12.2014)
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Journal Article