Work Function Measurement of Silicon Germanium Heterostructures Combining Kelvin Force Microscopy and X‑ray Photoelectron Emission Microscopy
Pouch, Sylvain, Amato, Michele, Bertocchi, Matteo, Ossicini, Stefano, Chevalier, Nicolas, Mélin, Thierry, Hartmann, Jean-Michel, Renault, Olivier, Delaye, Vincent, Mariolle, Denis, Borowik, Łukasz
Published in Journal of physical chemistry. C (25.11.2015)
Published in Journal of physical chemistry. C (25.11.2015)
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Electronic structure investigation of Al0.7Ga0.3As/GaAs nanometric heterostructures by Kelvin force microscopy
Pouch, S, Triozon, F, Chevalier, N, Mélin, T, Niquet, Y.-M, Borowik, .
Published in RSC advances (01.01.2016)
Published in RSC advances (01.01.2016)
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