A test structure set for on-wafer 3D-TRL calibration
Potereau, M., Curutchet, A., D'Esposito, R., De Matos, M., Fregonese, S., Zimmer, T.
Published in 2016 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2016)
Published in 2016 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2016)
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Conference Proceeding
Journal Article
High-Reliability Active Integrated Power Limiter with Sharp Compression Profile in Ka-Band in 130 nm SiGe Technology
Potereau, M., Deltimple, N., Ghiotto, A., Jardel, O., Rochette, S., Leblond, H., Villemazet, J.F.
Published in 2019 49th European Microwave Conference (EuMC) (01.10.2019)
Published in 2019 49th European Microwave Conference (EuMC) (01.10.2019)
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Conference Proceeding
High-Reliability Active Integrated Power Limiter with Sharp Compression Profile in Ka-Band in 130 nm SiGe Technology
Potereau, M., Deltimple, N., Ghiotto, A., Jardel, O., Rochette, S., Leblond, H., Villemazet, J.F.
Published in 2019 14th European Microwave Integrated Circuits Conference (EuMIC) (01.09.2019)
Published in 2019 14th European Microwave Integrated Circuits Conference (EuMIC) (01.09.2019)
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Conference Proceeding
Feasibility Demonstration of a Ka-Band Linearized Channel Amplifier in Silicon Technology for Space Applications
Jardel, O., Potereau, M., Leal, V. M., Rochette, S., Prades, J., Ghiotto, A., Leblond, H., Deltimple, N., Villemazet, J.F.
Published in 2019 14th European Microwave Integrated Circuits Conference (EuMIC) (01.09.2019)
Published in 2019 14th European Microwave Integrated Circuits Conference (EuMIC) (01.09.2019)
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Conference Proceeding
Fast Design Methodology of Stacked Transformers and Hybrid Couplers in SiGe Technology
Redois, S., Kerherve, E., Ghiotto, A., Potereau, M., Louis, B., Petit, V., Mancuso, Y.
Published in 2019 European Microwave Conference in Central Europe (EuMCE) (01.05.2019)
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Published in 2019 European Microwave Conference in Central Europe (EuMCE) (01.05.2019)
Conference Proceeding