by Kerber, A., Pompl, T., Rohner, M., Mosig, K., Kerber, M.
Published in IEEE electron device letters (01.07.2006)

by Pompl, T., Kerber, A., Röhner, M., Kerber, M.
Published in Microelectronics and reliability (01.09.2006)

by Hofmann, K, Reisinger, H, Ermisch, K, Schlunder, C, Gustin, W, Pompl, T, Georgakos, G, Arnim, K v, Hatsch, J, Kodytek, T, Baumann, T, Pacha, C
Published in 2010 Symposium on VLSI Technology (01.06.2010)

by Pompl, T., Engel, C., Wurzer, H., Kerber, M.
Published in Microelectronics and reliability (01.04.2001)

by Pompl, T., Schlünder, C., Hommel, M., Nielen, H., Schneider, J.
Published in 2006 43rd ACM/IEEE Design Automation Conference (24.07.2006)

by Pompl, T., Allers, K.-H., Schwab, R., Hofmann, K., Roehner, M.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)

by Pompl, T., Wurzer, H., Kerber, M., Eisele, I.
Published in Microelectronics and reliability (01.01.2000)

by Innertsberger, G, Pompl, T, Kerber, M
Published in Microelectronics and reliability (01.07.2001)

by Pompl, T., Kerber, M., Innertsberger, G., Allers, K.-H., Obry, M., Krasemann, A., Temmler, D.
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)

by Pompl, Thomas, Röhner, Michael
Published in Microelectronics and reliability (01.12.2005)

by Pompl, T., Wurzer, H., Kerber, M., Wilkins, R.C.W., Eisele, I.
Published in 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) (1999)

by Ille, A., Stadler, W., Pompl, T., Gossner, H., Brodbeck, T., Esmark, K., Riess, P., Alvarez, D., Chatty, K., Gauthier, R., Bravaix, A.
Published in 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.12.2009)

by Pompl, T., Bashir, T. Khan, Voelker, M., Last, F., Ostermayr, M.
Published in IEEE transactions on device and materials reliability (01.09.2023)

by Steegen, A., Mo, R., Mann, R., Sun, M.-C., Eller, M., Leake, G., Vietzke, D., Tilke, A., Guarin, F., Fischer, A., Pompl, T., Massey, G., Vayshenker, A., Tan, W.L., Ebert, A., Lin, W., Gao, W., Lian, J., Kim, J.-P., Wrschka, P., Yang, J.-H., Ajmera, A., Knoefler, R., Teh, Y.-W., Jamin, F., Park, J.E., Hooper, K., Griffin, C., Nguyen, P., Klee, V., Ku, V., Baiocco, C., Johnson, G., Tai, L., Benedict, J., Scheer, S., Zhuang, H., Ramanchandran, V., Matusiewicz, G., Lin, Y.-H., Siew, Y.K., Zhang, F., Leong, L.S., Liew, S.L., Park, K.C., Lee, K.-W., Hong, D.H., Choi, S.-M., Kaltalioglu, E., Kim, S.O., Naujok, M., Sherony, M., Cowley, A., Thomas, A., Sudijohno, J., Schiml, T., Ku, J.-H., Yang, I.
Published in IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest (2005)

by Kerber, A., Rohner, M., Pompl, T., Duschl, R., Kerber, M.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)

by Neubecker, Alexandra, Pompl, Thomas, Doll, Theodor, Hansch, Walter, Eisele, Ignaz
Published in Thin solid films (21.11.1997)

by Pompl, T., Kerber, M.
Published in IEEE transactions on device and materials reliability (01.06.2004)

by Fischer, A.H., Lim, Y.K., Riess, P., Pompl, T., Zhang, B.C., Chua, E.C., Keller, W.W., Tan, J.B., Klee, V., Tan, Y.C., Souche, D., Sohn, D.K., von Glasow, A.
Published in 2008 IEEE International Reliability Physics Symposium (01.04.2008)

by Pompl, T., Kerber, M., Wurzer, H., Eisele, I.
Published in 30th European Solid-State Device Research Conference (2000)

by Pompl, T., Mogul, H.C., Kerber, M., Haase, G., Ogawa, E., McPherson, J.W., Xiong, W., Schulz, T., Schrufer, K., Cleavelin, R.
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)