Three hot-carrier degradation mechanisms in deep-submicron PMOSFET's
Woltjer, R., Paulzen, G.M., Pomp, H.G., Lifka, H., Woerlee, P.H.
Published in IEEE transactions on electron devices (01.01.1995)
Published in IEEE transactions on electron devices (01.01.1995)
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Journal Article
Lightly nitrided gate oxides for 0.25 μm CMOS
Pomp, H.G., Kuiper, A.E.T., Lifka, H., Montree, A.H., Woerlee, P.H.
Published in Microelectronic engineering (01.08.1993)
Published in Microelectronic engineering (01.08.1993)
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Journal Article
Device characterisation of a high-performance 0.25 μm CMOS technology
Woerlee, P.H., Juffermans, C.A.H., Lifka, H., Manders, W.H., Pomp, H.G., Paulzen, G.M., Walker, A.J., Woltjer, R.
Published in Microelectronic engineering (1992)
Published in Microelectronic engineering (1992)
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Journal Article
New hot-carrier degradation mechanisms in 0.25 /spl mu/m PMOSFETs
Woltjer, R., Paulzen, G.M., Pomp, H.G., Lifka, H., Woerlee, P.H.
Published in Proceedings of 1994 VLSI Technology Symposium (1994)
Published in Proceedings of 1994 VLSI Technology Symposium (1994)
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Conference Proceeding
Device Characterisation of a High-Performance 0.25 μm CMOS Technology
Woerlee, P.H., Juffermans, C.A.H., Lifka, H., Manders, W.H., Pomp, H.G., Paulzen, G.M., Walker, A.J., Woltjer, R.
Published in ESSDERC '92: 22nd European Solid State Device Research conference (01.09.1992)
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Published in ESSDERC '92: 22nd European Solid State Device Research conference (01.09.1992)
Conference Proceeding
Lightly N/sub 2/O nitrided dielectrics grown in a conventional furnace for E/sup 2/PROM and 0.25 /spl mu/m CMOS
Pomp, H.G., Woerlee, P.H., Woltjer, R., Paulzen, G., Lifka, H., Kuiper, A.E.T., de Zaldivar, J.S., Vecsernyes, S.
Published in Proceedings of IEEE International Electron Devices Meeting (1993)
Published in Proceedings of IEEE International Electron Devices Meeting (1993)
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Conference Proceeding
A 25 mu m/sup 2/ bulk full CMOS SRAM cell technology with fully overlapping contacts
Verhaar, R.D.J., Augur, R.A., Aussems, C.N.A., de Bruin, L., Op den Buijsch, F.A.M., Dingen, L.W.M., Geuns, T.C.T., Havermans, W.J.M., Montree, A.H., van der Plas, P.A., Pomp, H.G., Vertregt, M., de Werdt, R., Wils, N.A.H., Woerlee, P.H.
Published in International Technical Digest on Electron Devices (1990)
Published in International Technical Digest on Electron Devices (1990)
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Conference Proceeding