Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization
Polovodov, Petr, Théron, Didier, Lenoir, Clément, Deresmes, Dominique, Eliet, Sophie, Boyaval, Christophe, Dambrine, Gilles, Haddadi, Kamel
Published in Applied sciences (01.03.2021)
Published in Applied sciences (01.03.2021)
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Journal Article
Electromagnetic Modeling in Near-Field Scanning Microwave Microscopy Highlighting Limitations in Spatial and Electrical Resolutions
Polovodov, P., Brillard, C., Haenssler, O. C., Boyaval, C., Deresmes, D., Eliet, S., Wang, F., Clement, N., Theron, D., Dambrine, G., Haddadi, K.
Published in 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO) (01.08.2018)
Published in 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO) (01.08.2018)
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Conference Proceeding