Evaluation strategies for multi-layer, multi-material ellipsometric measurements
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Conference Proceeding
Dielectric function of disorder in high-fluence helium-implanted silicon
Petrik, P., Fried, M., Lohner, T., Khánh, N.Q., Basa, P., Polgár, O., Major, C., Gyulai, J., Cayrel, F., Alquier, D.
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.12.2006)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.12.2006)
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Journal Article
Frailty and Mortality Risk in COPD: A Cohort Study Comparing the Fried Frailty Phenotype and Short Physical Performance Battery
Brighton, Lisa Jane, Nolan, Claire M, Barker, Ruth E, Patel, Suhani, Walsh, Jessica A, Polgar, Oliver, Kon, Samantha S C, Gao, Wei, Evans, Catherine J, Maddocks, Matthew, Man, William D C
Published in International journal of chronic obstructive pulmonary disease (01.01.2023)
Published in International journal of chronic obstructive pulmonary disease (01.01.2023)
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Journal Article
Expanded beam (macro-imaging) ellipsometry
Fried, M., Juhász, G., Major, C., Petrik, P., Polgár, O., Horváth, Z., Nutsch, A.
Published in Thin solid films (28.02.2011)
Published in Thin solid films (28.02.2011)
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Journal Article
Conference Proceeding
Integrating Home-Based Exercise Training with a Hospital at Home Service for Patients Hospitalised with Acute Exacerbations of COPD: Developing the Model Using Accelerated Experience-Based Co-Design
Barker, Ruth E, Brighton, Lisa J, Maddocks, Matthew, Nolan, Claire M, Patel, Suhani, Walsh, Jessica A, Polgar, Oliver, Wenneberg, Jenni, Kon, Samantha S C, Wedzicha, Jadwiga A, Man, William D C, Farquhar, Morag
Published in International journal of chronic obstructive pulmonary disease (01.01.2021)
Published in International journal of chronic obstructive pulmonary disease (01.01.2021)
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Journal Article
Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry
Petrik, P., Gumprecht, T., Nutsch, A., Roeder, G., Lemberger, M., Juhasz, G., Polgar, O., Major, C., Kozma, P., Janosov, M., Fodor, B., Agocs, E., Fried, M.
Published in Thin solid films (01.08.2013)
Published in Thin solid films (01.08.2013)
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Journal Article
Conference Proceeding
Mutational Analysis of ABCG2: Role of the GXXXG Motif
Polgar, Orsolya, Robey, Robert W, Morisaki, Kuniaki, Dean, Michael, Michejda, Christopher, Sauna, Zuben E, Ambudkar, Suresh V, Tarasova, Nadya, Bates, Susan E
Published in Biochemistry (Easton) (27.07.2004)
Published in Biochemistry (Easton) (27.07.2004)
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Journal Article
Application of wide angle beam spectroscopic ellipsometry for quality control in solar cell production
Major, C., Juhász, G., Petrik, P., Horváth, Z., Polgár, O., Fried, M.
Published in Vacuum (25.08.2009)
Published in Vacuum (25.08.2009)
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Journal Article
Non-collimated beam ellipsometry
Juhász, G., Horváth, Z., Major, C., Petrik, P., Polgár, O., Fried, M.
Published in Physica status solidi. C (01.05.2008)
Published in Physica status solidi. C (01.05.2008)
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Journal Article
Characterization of damage structure in ion implanted SiC using high photon energy synchrotron ellipsometry
Petrik, P., Zolnai, Z., Polgar, O., Fried, M., Betyak, Z., Agocs, E., Lohner, T., Werner, C., Röppischer, M., Cobet, C.
Published in Thin solid films (28.02.2011)
Published in Thin solid films (28.02.2011)
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Journal Article
Conference Proceeding
Ellipsometric characterization of nanocrystals in porous silicon
Petrik, P., Fried, M., Vázsonyi, É., Lohner, T., Horváth, E., Polgár, O., Basa, P., Bársony, I., Gyulai, J.
Published in Applied surface science (31.10.2006)
Published in Applied surface science (31.10.2006)
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Journal Article
Conference Proceeding
Wide angle beam ellipsometry for extremely large samples
Major, C., Juhász, G., Horváth, Z., Polgar, O., Fried, M.
Published in Physica status solidi. C (01.05.2008)
Published in Physica status solidi. C (01.05.2008)
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Journal Article
Dose-dependence of ion implantation-caused damage in silicon measured by ellipsometry and backscattering spectrometry
Fried, M., Petrik, P., Lohner, T., Khánh, N.Q., Polgár, O., Gyulai, J.
Published in Thin solid films (01.05.2004)
Published in Thin solid films (01.05.2004)
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Journal Article
Ellipsometric characterization of oxidized porous silicon layer structures
Lohner, T, Fried, M, Petrik, P, Polgár, O, Gyulai, J, Lehnert, W
Published in Materials science & engineering. B, Solid-state materials for advanced technology (01.01.2000)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (01.01.2000)
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Journal Article
Conference Proceeding
Depth distribution of disorder and cavities in high dose helium implanted silicon characterized by spectroscopic ellipsometry
Petrik, P., Cayrel, F., Fried, M., Polgár, O., Lohner, T., Vincent, L., Alquier, D., Gyulai, J.
Published in Thin solid films (01.05.2004)
Published in Thin solid films (01.05.2004)
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