HIV AND SOCIAL NETWORKS AMONG BLACK AND LATINX SEXUAL AND GENDER MINORITIES LIVING IN NYC: PRELIMINARY FINDINGS FROM A CONVERGENT MULTIMETHOD APPROACH
Shrader, CH, Driver, L, Poku, O, DeLespinasse, C, Hamner, A, Pogue, S, Knox, J, Schneider, J, Kanamori, M, Ompad, DC, Duncan, DT
Published in Drug and alcohol dependence (01.08.2024)
Published in Drug and alcohol dependence (01.08.2024)
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Characterization of low power research reactor neutrons for the validation of k(0)-INAA standardization based on k(0)-IAEA software
Baidoo, I K, Nyarko, B J B, Akaho, E H K, Dampare, S B, Sogbadji, R B M, Poku, L O
Published in Applied radiation and isotopes (01.09.2013)
Published in Applied radiation and isotopes (01.09.2013)
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Journal Article
A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior
Desineni, R., Poku, O., Blanton, R.D.
Published in 2006 IEEE International Test Conference (01.10.2006)
Published in 2006 IEEE International Test Conference (01.10.2006)
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Conference Proceeding
Characterization of low power research reactor neutrons for the validation of k0-INAA standardization based on k0-IAEA software
Baidoo, I.K., Nyarko, B.J.B., Akaho, E.H.K., Dampare, S.B., Sogbadji, R.B.M., Poku, L.O.
Published in Applied radiation and isotopes (01.09.2013)
Published in Applied radiation and isotopes (01.09.2013)
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Journal Article
Test-data volume optimization for diagnosis
Wang, Hongfei, Poku, Osei, Yu, Xiaochun, Liu, Sizhe, Komara, Ibrahima, Blanton, R. D.
Published in DAC Design Automation Conference 2012 (03.06.2012)
Published in DAC Design Automation Conference 2012 (03.06.2012)
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Conference Proceeding
Application of k0-method in instrumental neutron activation analysis to glass matrix: test study for low power research reactor GHARR-1
Baidoo, I. K., Nyarko, B. J. B., Akaho, E. H. K., Dampare, S. B., Poku, L. O., Gbadago, J. K., Quacoo, E. A., Opata, N. S., Quagraine, R. E.
Published in Journal of radioanalytical and nuclear chemistry (01.03.2013)
Published in Journal of radioanalytical and nuclear chemistry (01.03.2013)
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Journal Article
Systematic defect identification through layout snippet clustering
Wing Chiu Tam, Poku, O, Blanton, R D
Published in 2010 IEEE International Test Conference (01.11.2010)
Published in 2010 IEEE International Test Conference (01.11.2010)
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Conference Proceeding
Physically-Aware N -Detect Test
Yen-Tzu Lin, Poku, O., Bhatti, Naresh K., Blanton, R. D. S., Nigh, P., Lloyd, Peter, Iyengar, V.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.02.2012)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.02.2012)
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Journal Article
Extracting Defect Density and Size Distributions from Product ICs
Nelson, J.E., Zanon, T., Brown, J.G., Poku, O., Blanton, R.D., Maly, W., Benware, B., Schuermyer, C.
Published in IEEE design & test of computers (01.09.2006)
Published in IEEE design & test of computers (01.09.2006)
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Journal Article
Precise failure localization using automated layout analysis of diagnosis candidates
Tam, Wing Chiu, Poku, Osei, Blanton, R. D. Shawn
Published in 2008 45th ACM/IEEE Design Automation Conference (08.06.2008)
Published in 2008 45th ACM/IEEE Design Automation Conference (08.06.2008)
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Conference Proceeding
Controlling DPPM through Volume Diagnosis
Xiaochun Yu, Yen-Tzu Lin, Wing-Chiu Tam, Poku, O., Blanton, R.D.
Published in 2009 27th IEEE VLSI Test Symposium (01.05.2009)
Published in 2009 27th IEEE VLSI Test Symposium (01.05.2009)
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Conference Proceeding
Physically-Aware N-Detect Test Pattern Selection
Yen-Tzu Lin, Poku, O., Bhatti, N.K., Blanton, R.D.
Published in 2008 Design, Automation and Test in Europe (01.03.2008)
Published in 2008 Design, Automation and Test in Europe (01.03.2008)
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Conference Proceeding
Automated failure population creation for validating integrated circuit diagnosis methods
Tam, Wing Chiu, Poku, Osei, Blanton, R. D. (Shawn)
Published in 2009 46th ACM/IEEE Design Automation Conference (26.07.2009)
Published in 2009 46th ACM/IEEE Design Automation Conference (26.07.2009)
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Conference Proceeding
Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon
Yen-Tzu Lin, Poku, O., Blanton, R.D., Nigh, P., Lloyd, P., Iyengar, V.
Published in 2008 IEEE International Test Conference (01.10.2008)
Published in 2008 IEEE International Test Conference (01.10.2008)
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Conference Proceeding
Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations
Blanton, R. D., Tam, W. C., Xiaochun Yu, Nelson, J. E., Poku, O.
Published in IEEE design & test of computers (01.01.2012)
Published in IEEE design & test of computers (01.01.2012)
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