A Characterization Method for TID Versus Temperature Effects on Microelectronic Circuits
Rizzo, Marta, Muschitiello, Michele, Gupta, Viyas, Poizat, Marc
Published in IEEE transactions on nuclear science (01.08.2024)
Published in IEEE transactions on nuclear science (01.08.2024)
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Journal Article
Influence of Beam Conditions and Energy for SEE Testing
Ferlet-Cavrois, Veronique, Schwank, James R., Liu, Sandra, Muschitiello, Michele, Beutier, Thierry, Javanainen, Arto, Hedlund, Alex, Poivey, Christian, Mohammadzadeh, Ali, Harboe-Sorensen, Reno, Santin, Giovanni, Nickson, Bob, Menicucci, Alessandra, Binois, Christian, Peyre, Daniel, Hoeffgen, Stefan Klaus, Metzger, Stefan, Schardt, Dieter, Kettunen, Heikki, Virtanen, Ari, Berger, Guy, Piquet, Bruno, Foy, Jean-Claude, Zafrani, Max, Truscott, Pete, Poizat, Marc, Bezerra, Francoise
Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Journal Article
Proton-Induced Mobility Degradation in FinFETs With Stressor Layers and Strained SOI Substrates
Kobayashi, D, Simoen, E, Put, S, Griffoni, A, Poizat, M, Hirose, K, Claeys, C
Published in IEEE transactions on nuclear science (01.06.2011)
Published in IEEE transactions on nuclear science (01.06.2011)
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Journal Article
Enhanced Low Dose Rate Sensitivity Analysis
Nunez, David, Poizat, Marc, Jimenez, Joaquin, Munoz, Eugenio, Dominguez, Manuel
Published in 2014 IEEE Radiation Effects Data Workshop (REDW) (01.07.2014)
Published in 2014 IEEE Radiation Effects Data Workshop (REDW) (01.07.2014)
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Conference Proceeding
Testing of COTS Operational Amplifier in the Framework of the ESA CORHA Study
Tscherne, Christoph, Wind, Michael, Bagatin, Marta, Gerardin, Simone, Latocha, Marcin, Paccagnella, Alessandro, Poizat, Marc, Beck, Peter
Published in 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2020)
Published in 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2020)
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Conference Proceeding
Single event sensitivity and de-rating of SiC power devices to heavy ions and protons
Steffens, Michael, Hoffgen, Stefan K., Kundgen, Tobias, Paschkowski, Eike, Poizat, Marc, Wolk, Dorothea
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
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Conference Proceeding
Testing of COTS Multiplexer in the Framework of the ESA CORHA Study
Wind, Michael, Tscherne, Christoph, Bagatin, Marta, Gerardin, Simone, Huber, Lukas, Latocha, Marcin, Paccagnella, Alessandro, Poizat, Marc, Beck, Peter
Published in 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2021)
Published in 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2021)
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Conference Proceeding
Compendium of Total Ionizing Dose, Displacement Damage and Single Event Transient Test Data of Various Optocouplers for ESA
Poizat, Marc, Sauvagnac, Maryse, Samaras, Anne, Padie, Yannick, Garcia, Pierre, Renaud, Benjamin, Gouyet, Lionel, Abadi, Jean Paul, Widmeer, Fabien, Le Goulven, Enoal, Vaille, Maxime, Vandevelde, Benjamin, Caunes, Thomas, Puybusque, Ludovic, Vignon, Gael, Salvy, Lionel, Rousset, Alexandre, Chatry, Christian, Erd, Christian, Poivey, Christian, Ferlet-Cavrois, Veronique, Boatella-Polo, Cesar, Zadeh, Ali
Published in 2013 IEEE Radiation Effects Data Workshop (REDW) (01.07.2013)
Published in 2013 IEEE Radiation Effects Data Workshop (REDW) (01.07.2013)
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Conference Proceeding
Pulsed laser beam identification of SEEsensitive regions and observation of additional failure modes relevant for RHA in Digital Isolators
Wolf, Raphael, Steffens, Michael, Metzger, Stefan, Beck, Peter, Wind, Michael, Poizat, Marc
Published in 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2017)
Published in 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2017)
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Conference Proceeding
Comprehensive radiation characterization of digital isolators
Wind, Michael, Bagalkote, Jayasimha V., Clemens, Peter, Kundgen, Tobias, Latocha, Marcin, Lennartz, Wilhelm, Metzger, Stefan, Poizat, Marc, Ruge, Sven, Steffens, Michael, Beck, Peter
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2016)
Published in 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2016)
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Conference Proceeding
Radiation Evaluation of Digital Isolators for Space Applications
Beck, Peter, Wind, Michael, Clemens, Peter, KUndgen, Tobias, Latocha, Marcin, Lennartz, Wilhelm, Metzger, Stefan, Poizat, Marc, Ruge, Sven, Steffens, Michael, Tscherne, Christoph
Published in 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2017)
Published in 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.10.2017)
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Conference Proceeding
TID and SEGR Radiation Characterisation of European COTS Power MOSFETs with Respect to Space Application Electronics
Wind, Michael, Bagalkote, Jayasimha V., Beck, Peter, Latocha, Marcin, Poizat, Marc
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
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Conference Proceeding
Proton, electron and heavy ion single event effects on the HAS2 CMOS Image Sensor
Beaumel, Matthieu, Herve, Dominique, Van Aken, Dirk, Pourrouquet, Pierre, Poizat, Marc
Published in 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2013)
Published in 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2013)
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Conference Proceeding