by Coquand, R., Casse, M., Barraud, S., Cooper, D., Maffini-Alvaro, V., Samson, M., Monfray, S., Boeuf, F., Ghibaudo, G., Faynot, O., Poiroux, T.
Published in IEEE transactions on electron devices (01.02.2013)

by Mazurier, J., Weber, O., Andrieu, F., Toffoli, A., Rozeau, O., Poiroux, T., Allain, F., Perreau, P., Fenouillet-Beranger, C., Thomas, O., Belleville, M., Faynot, O.
Published in IEEE transactions on electron devices (01.08.2011)

by Poli, S., Pala, M.G., Poiroux, T., Deleonibus, S., Baccarani, G.
Published in IEEE transactions on electron devices (01.11.2008)

by Nuo Xu, Ho, Byron, Andrieu, F., Smith, L., Bich-Yen Nguyen, Weber, O., Poiroux, T., Faynot, O., Tsu-Jae King Liu
Published in IEEE electron device letters (01.03.2012)

by Barral, V., Poiroux, T., Saint-Martin, J., Munteanu, D., Autran, J.-L., Deleonibus, S.
Published in IEEE transactions on electron devices (01.03.2009)

by Nuo Xu, Andrieu, F., Ho, Byron, Bich-Yen Nguyen, Weber, O., Mazure, Carlos, Faynot, O., Poiroux, T., Tsu-Jae King Liu
Published in 2012 Symposium on VLSI Technology (VLSIT) (01.06.2012)

by Ghibaudo, G., Aouad, M., Casse, M., Martinie, S., Poiroux, T., Balestra, F.
Published in Solid-state electronics (01.08.2020)

by Pradeep, Krishna, Scheer, Patrick, Poiroux, Thierry, Juge, André, Ghibaudo, Gérard
Published in Semiconductor science and technology (01.05.2020)

by NOEL, Jean-Philippe, THOMAS, Olivier, ROZEAU, Olivier, BOEUF, Frédéric, FAYNOT, Olivier, AMARA, Amara, JAUD, Marie-Anne, WEBER, Olivier, POIROUX, Thierry, FENOUILLET-BERANGER, Claire, RIVALLIN, Pierrette, SCHEIBLIN, Pascal, ANDRIEU, François, VINET, Maud
Published in IEEE transactions on electron devices (2011)

by Noel, Jean-Philippe, Thomas, Olivier, Jaud, Marie-Anne, Weber, Olivier, Poiroux, Thierry, Fenouillet-Beranger, Claire, Rivallin, Pierrette, Scheiblin, Pascal, Andrieu, Francois, Vinet, Maud, Rozeau, Olivier, Boeuf, Frederic, Faynot, Olivier, Amara, Amara
Published in IEEE transactions on electron devices (01.08.2011)

by Pradeep, Krishna, Poiroux, Thierry, Scheer, Patrick, Juge, André, Ghibaudo, Gérard
Published in Solid-state electronics (01.01.2020)

by Pradeep, Krishna, Poiroux, Thierry, Scheer, Patrick, Juge, André, Gouget, Gilles, Ghibaudo, Gérard
Published in Solid-state electronics (01.07.2018)

by El Ghouli, Salim, Rideau, Denis, Monsieur, Frederic, Scheer, Patrick, Gouget, Gilles, Juge, André, Poiroux, Thierry, Sallese, Jean-Michel, Lallement, Christophe
Published in IEEE transactions on electron devices (01.01.2018)

by Poiroux, Thierry, Rozeau, O., Scheer, Patrick, Martinie, Sebastien, Jaud, Marie-Anne, Minondo, M., Juge, Andre, Barbe, J. C., Vinet, Maud
Published in IEEE transactions on electron devices (01.09.2015)

by El Ghouli, Salim, Rideau, Denis, Monsieur, Frederic, Scheer, Patrick, Gouget, Gilles, Juge, Andre, Poiroux, Thierry, Sallese, Jean-Michel, Lallement, Christophe
Published in IEEE transactions on electron devices (01.01.2018)

by Theodorou, Christoforos G., Ioannidis, Eleftherios G., Andrieu, Francois, Poiroux, Thierry, Faynot, Olivier, Dimitriadis, Charalabos A., Ghibaudo, Gerard
Published in IEEE transactions on electron devices (01.04.2014)

by Rostand, N., Martinie, S., Gaillardin, M., Marcandella, C., Rozeau, O., Lacord, J., Barbe, J.-C., Poiroux, T., Hubert, G.
Published in IEEE transactions on nuclear science (01.07.2019)

by Rostand, Neil, Martinie, Sebastien, Lacord, Joris, Rozeau, Olivier, Poiroux, Thierry, Hubert, Guillaume
Published in 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2019)

by Martinie, Sebastien, Rozeau, Olivier, Poiroux, Thierry, Scheer, Patrick, Ghouli, Salim El, Kang, Mihyun, Juge, Andre, Lee, Harrison
Published in 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (23.09.2020)

by Vaysset, Adrien, Martinie, Sebastien, Triozon, Francois, Rozeau, Olivier, Jaud, Marie-Anne, Escoffier, Rene, Poiroux, Thierry
Published in 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (23.09.2020)