Relevance of off-state NBTI degradation in depletion HVNMOS transistor for power application
Strasser, Marc, Stradiotto, Roberta, Aresu, Stefano, Puschkarsky, Katja, Poehle, Holger, Gustin, Wolfgang
Published in 2018 International Integrated Reliability Workshop (IIRW) (01.10.2018)
Published in 2018 International Integrated Reliability Workshop (IIRW) (01.10.2018)
Get full text
Conference Proceeding
Semiconductor die bond pad with insulating separator
Stavrev, Momtchil, Bretthauer, Christian, Poehle, Holger, Laumer, Bernhard
Year of Publication 02.04.2019
Get full text
Year of Publication 02.04.2019
Patent
Semiconductor Die Bond Pad with Insulating Separator
Stavrev, Momtchil, Bretthauer, Christian, Poehle, Holger, Laumer, Bernhard
Year of Publication 21.03.2019
Get full text
Year of Publication 21.03.2019
Patent
Semiconductor Die Bond Pad with Insulating Separator
LAUMER BERNHARD, BRETTHAUER CHRISTIAN, POEHLE HOLGER, STAVREV MOMTCHI
Year of Publication 26.03.2019
Get full text
Year of Publication 26.03.2019
Patent
Halbleiter-Die-Bondpad mit isolierendem Separator
Stavrev, Momtchi, Bretthauer, Christian, Poehle, Holger, Laumer, Bernhard
Year of Publication 21.03.2019
Get full text
Year of Publication 21.03.2019
Patent
A study of fluorine implant in the formation of low leakage P+/N junction in BiCMOS technologies
Saad, Siti Zubaidah Md, Lik, T. C., Othman, M. A., Holger, P., Herman, S. H.
Published in 2012 International Conference on Enabling Science and Nanotechnology (01.01.2012)
Published in 2012 International Conference on Enabling Science and Nanotechnology (01.01.2012)
Get full text
Conference Proceeding
An improved P+/N diode leakage current in BiCMOS technologies with fluorine co-implant
Saad, S. Z. M., Tan Chan Lik, Othman, M. A., Holger, P., Herman, S. H.
Published in 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) (01.09.2012)
Published in 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) (01.09.2012)
Get full text
Conference Proceeding