Mobility Modeling and Its Extraction Technique for Manufacturing Strained-Si MOSFETs
Jhong-Sheng Wang, Po-Nien Chen, W., Chun-Hsing Shih, Chenhsin Lien, Pin Su, Yi-Ming Sheu, Yuan-Shun Chao, D., Goto, K.-I.
Published in IEEE electron device letters (01.11.2007)
Published in IEEE electron device letters (01.11.2007)
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