Electrical characterization of AMS aH18 HV-CMOS after neutrons and protons irradiation
Sultan, DMS, Sevilla, S. Gonzalez, Ferrere, D., Iacobucci, G., Zaffaroni, E., Wong, W., Pinto, M.V. Barrero, Kiehn, M., Prathapan, M., Ehrler, F., Peric, I., Miucci, A., Anders, J. Kenneth, Fehr, A., Weber, M., Schoening, A., Herkert, A., Augustin, H., Benoit, M.
Published in Journal of instrumentation (07.05.2019)
Published in Journal of instrumentation (07.05.2019)
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