A wide tuning range gated varactor
Wong, W.M.Y., Ping Shing Hui, Zhiheng Chen, Keqiang Shen, Lau, J., Chan, P.C.H., Ping-Keung Ko
Published in IEEE journal of solid-state circuits (01.05.2000)
Published in IEEE journal of solid-state circuits (01.05.2000)
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Journal Article
Berkeley reliability tools-BERT
Tu, R.H., Rosenbaum, E., Chan, W.Y., Li, C.C., Minami, E., Quader, K., Ko, P.K., Hu, C.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.1993)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.1993)
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Journal Article
Hot-electron-induced MOSFET degradation-Model, monitor, and improvement
Chenming Hu, Simon C. Tam, Fu-Chieh Hsu, Ping-Keung Ko, Tung-Yi Chan, Terrill, K.W.
Published in IEEE transactions on electron devices (01.02.1985)
Published in IEEE transactions on electron devices (01.02.1985)
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Journal Article
Hot-Electron-Induced MOSFET Degradation - Model, Monitor, and Improvement
Chenming Hu, Simon C. Tam, Fu-Chieh Hsu, Ping-Keung Ko, Tung-Yi Chan, Terrill, K.W.
Published in IEEE journal of solid-state circuits (01.02.1985)
Published in IEEE journal of solid-state circuits (01.02.1985)
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Journal Article
A physical and scalable I-V model in BSIM3v3 for analog/digital circuit simulation
Yuhua Cheng, Min-Chie Jeng, Zhihong Liu, Jianhui Huang, Chan, Mansun, Kai Chen, Ping Keung Ko, Chenming Hu
Published in IEEE transactions on electron devices (01.02.1997)
Published in IEEE transactions on electron devices (01.02.1997)
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Journal Article
The effects of low-angle off-axis substrate orientation on MOSFET performance and reliability
Chung, J.E., Chen, J., Ko, P.-K., Hu, C., Levi, M.
Published in IEEE transactions on electron devices (01.03.1991)
Published in IEEE transactions on electron devices (01.03.1991)
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Journal Article
A framework to evaluate technology and device design enhancements for MOS integrated circuits
Sodini, C.G., Wong, S.S., Ping-Keung Ko
Published in IEEE journal of solid-state circuits (01.02.1989)
Published in IEEE journal of solid-state circuits (01.02.1989)
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Journal Article
CASFET: A MOSFET-JFET cascode device with ultralow gate capacitance
Jackel, L.D., Swartz, R.G., Howard, R.E., Ping-Keung Ko, Grabbe, P.
Published in IEEE transactions on electron devices (01.12.1984)
Published in IEEE transactions on electron devices (01.12.1984)
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Journal Article
BSIM: Berkeley short-channel IGFET model for MOS transistors
Sheu, B.J., Scharfetter, D.L., Ko, P.-K., Jeng, M.-C.
Published in IEEE journal of solid-state circuits (01.08.1987)
Published in IEEE journal of solid-state circuits (01.08.1987)
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Journal Article
The effect of high fields on MOS device and circuit performance
Sodini, C.G., Ping-Keung Ko, Moll, J.L.
Published in IEEE transactions on electron devices (01.10.1984)
Published in IEEE transactions on electron devices (01.10.1984)
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Journal Article
Low-voltage hot-electron currents and degradation in deep-submicrometer MOSFETs
Chung, J.E., Jeng, M.-C., Moon, J.E., Ko, P.-K., Hu, C.
Published in IEEE transactions on electron devices (01.07.1990)
Published in IEEE transactions on electron devices (01.07.1990)
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Journal Article
Inversion-layer capacitance and mobility of very thin gate-Oxide MOSFET's
Mong-Song Liang, Jeong Yeol Choi, Ping-Keung Ko, Chenming Hu
Published in IEEE transactions on electron devices (01.03.1986)
Published in IEEE transactions on electron devices (01.03.1986)
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Journal Article
A charge sheet capacitance model of short channel MOSFETs for SPICE
Park, H.-J., Ko, P.K., Hu, C.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.1991)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.03.1991)
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Journal Article
Performance and reliability design issues for deep-submicrometer MOSFETs
Chung, J.E., Jeng, M.-C., Moon, J.E., Ko, P.-K., Hu, C.
Published in IEEE transactions on electron devices (01.03.1991)
Published in IEEE transactions on electron devices (01.03.1991)
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Journal Article