An integrated system for monitoring the quality of sample transportation
Zaninotto, M., Tasinato, A., Padoan, A., Vecchiato, G., Pinato, A., Sciacovelli, L., Plebani, M.
Published in Clinical biochemistry (01.06.2012)
Published in Clinical biochemistry (01.06.2012)
Get full text
Journal Article
Impact of Trapped Charge and Interface Defects on the Degradation of the Optical and Electrical Characteristics in \hbox OLEDs
Pinato, A., Cester, A., Meneghini, M., Wrachien, N., Tazzoli, A., Xia, S., Adamovich, V., Weaver, M.S., Brown, J.J., Zanoni, E., Meneghesso, G.
Published in IEEE transactions on electron devices (01.01.2010)
Published in IEEE transactions on electron devices (01.01.2010)
Get full text
Journal Article
Light, bias, and temperature effects on organic TFTs
Wrachien, N, Cester, A, Bellaio, N, Pinato, A, Meneghini, M, Tazzoli, A, Meneghesso, G, Myny, K, Smout, S, Genoe, J
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Get full text
Conference Proceeding
Improved reliability of organic light-emitting diodes with indium-zinc-oxide anode contact
Pinato, A., Meneghini, M., Cester, A., Wrachien, N., Tazzoli, A., Zanoni, E., Meneghesso, G., D'Andrade, B., Esler, J., Xia, S., Brown, J.
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Get full text
Conference Proceeding
Organic TFT with SiO2-parylene gate dielectric stack and optimized pentacene growth temperature
Wrachien, N., Cester, A., Pinato, A., Meneghini, M., Tazzoli, A., Meneghesso, G., Kovac, J., Jakabovic, J., Donoval, D.
Published in 2009 Proceedings of the European Solid State Device Research Conference (01.09.2009)
Published in 2009 Proceedings of the European Solid State Device Research Conference (01.09.2009)
Get full text
Conference Proceeding
Threshold voltage instability in organic TFT with SiO2 and SiO2/parylene-stack dielectrics
Wrachien, N., Cester, A., Pinato, A., Meneghini, M., Tazzoli, A., Meneghesso, G., Kovac, J., Jakabovic, J., Donoval, D.
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Get full text
Conference Proceeding