Angle- and polarization resolved antireflection properties of black silicon prepared by electrochemical etching supported by external electric field
Müllerová, Jarmila, Scholtz, Ľubomír, Ďurišová, Jana, Pinčík, Emil, Solanská, Michaela, Pudiš, Dušan
Published in Applied surface science (15.12.2018)
Published in Applied surface science (15.12.2018)
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Journal Article
Optical properties of electrochemically etched N-type silicon wafers for solar cell applications
Králik, Martin, Goraus, Matej, Pinčík, Emil
Published in Journal of Electrical Engineering (01.12.2020)
Published in Journal of Electrical Engineering (01.12.2020)
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Journal Article
Multifractal analysis of textured silicon surfaces
Jurečka, Stanislav, Angermann, Heike, Kobayashi, Hikaru, Takahashi, Masao, Pinčík, Emil
Published in Applied surface science (15.05.2014)
Published in Applied surface science (15.05.2014)
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Journal Article
Conference Proceeding
Black silicon – correlation between microstructure and Raman scattering
Jurečka, Stanislav, Pinčík, Emil, Imamura, Kentaro, Matsumoto, Taketoshi, Kobayashi, Hikaru
Published in Journal of Electrical Engineering (01.12.2019)
Published in Journal of Electrical Engineering (01.12.2019)
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Journal Article
About complex refractive index of black Si
Pinčík, Emil, Brunner, Robert, Kobayashi, Hikaru, Mikula, Milan
Published in Journal of Electrical Engineering (01.12.2017)
Published in Journal of Electrical Engineering (01.12.2017)
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Journal Article
Properties of HfO2/ultrathin SiO2/Si structures and their comparison with Si MOS structures passivated in KCN solution
Pinčík, Emil, Kobayashi, Hikaru, Matsumoto, Taketoshi, Takahashi, Masao, Mikula, Milan, Brunner, Róbert
Published in Applied surface science (15.05.2014)
Published in Applied surface science (15.05.2014)
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Journal Article
Conference Proceeding
On KCN treatment effects on optical properties of Si-based bilayers
Müllerová, Jarmila, Pinčík, Emil, Králik, Martin, Holá, Michaela, Takahashi, Masao, Kobayashi, Hikaru
Published in Journal of Electrical Engineering (01.12.2019)
Published in Journal of Electrical Engineering (01.12.2019)
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Journal Article
Properties of charge states in MOS structure with ultrathin oxide layer
Jurečka, Stanislav, Kobayashi, Hikaru, Takahashi, Masao, Matsumoto, Taketoshi, Pinčík, Emil
Published in Applied surface science (15.08.2012)
Published in Applied surface science (15.08.2012)
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Journal Article
Conference Proceeding
The effect of KCN passivation on IR spectra of a-Si based structures
Kopani, Martin, Mikula, Milan, Fujiwara, Naozumi, Takahashi, Masao, Pinčík, Emil
Published in Applied surface science (15.08.2012)
Published in Applied surface science (15.08.2012)
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Journal Article
Conference Proceeding
Temperature dependence of photoluminescence peaks of porous silicon structures
Brunner, Róbert, Pinčík, Emil, Kučera, Michal, Greguš, Ján, Vojtek, Pavel, Zábudlá, Zuzana
Published in Journal of Electrical Engineering (01.12.2017)
Published in Journal of Electrical Engineering (01.12.2017)
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Journal Article
Passivation of Si-based structures in HCN and KCN solutions
Pinčík, Emil, Kobayashi, Hikaru, Rusnák, Jaroslav, Takahashi, Masao, Mikula, Milan, Kim, Woo Byoung, Kučera, Michal, Brunner, Robert, Jurečka, Stanislav
Published in Applied surface science (15.08.2012)
Published in Applied surface science (15.08.2012)
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Journal Article
Conference Proceeding
On the influence of the surface roughness onto the ultrathin SiO2/Si structure properties
Jurečka, Stanislav, Kobayashi, Hikaru, Takahashi, Masao, Matsumoto, Taketoshi, Jurečková, Mária, Chovanec, Ferdinand, Pinčík, Emil
Published in Applied surface science (01.07.2010)
Published in Applied surface science (01.07.2010)
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Journal Article
Study of density of interface states in MOS structure with ultrathin NAOS oxide
Jurečka, Stanislav, Kobayashi, Hikaru, Kim, Woo-Byoung, Takahashi, Masao, Pinčík, Emil
Published in Central European journal of physics (01.02.2012)
Published in Central European journal of physics (01.02.2012)
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Journal Article
On interface properties of ultra-thin and very-thin oxide/a-Si:H structures prepared by oxygen based plasmas and chemical oxidation
PINCIK, Emil, KOBAYASHI, Hikaru, RUSNAK, Jaroslav, HAJOSSY, Rudolf, GLESKOVA, Helena, TAKAHASHI, Masao, JERGEL, Matej, BMNNER, Robert, ORTEGA, Luc, KUCERA, Michal, KRAL', Martin
Published in Applied surface science (15.06.2007)
Published in Applied surface science (15.06.2007)
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Journal Article
On the topographic and optical properties of SiC/SiO2 surfaces
Jureckova, Stanislav, Jureckova, Maria, Chovanec, Ferdinand, Kobayashi, Hikaru, Takahashi, Masao, Mikula, Milan, Pina, Emil
Published in Central European journal of physics (01.06.2009)
Published in Central European journal of physics (01.06.2009)
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Journal Article
On formation of thin SiO2/a-Si:H interface when biased oxidized semiconductor surface interacts with plasma or liquid solution
Pinčík, Emil, Kobayashi, Hikaru, Takahashi, Masao, Brunner, Róbert, Jurečka, Stanislav, Rusnák, Jaroslav
Published in Open Physics (01.09.2007)
Published in Open Physics (01.09.2007)
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Journal Article
9th Solid State Surfaces and Interfaces, November 21-24, 2016, Piešťany Slovakia
Pinčík, Emil, Brunner, Róbert, Bačová, Silvia, Zitto, Peter
Published in Journal of Electrical Engineering (01.12.2017)
Published in Journal of Electrical Engineering (01.12.2017)
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Journal Article