In Situ Time-of-Flight Mass Spectrometry of Ionic Fragments Induced by Focused Electron Beam Irradiation: Investigation of Electron Driven Surface Chemistry inside an SEM under High Vacuum
Jurczyk, Jakub, Pillatsch, Lex, Berger, Luisa, Priebe, Agnieszka, Madajska, Katarzyna, Kapusta, Czesław, Szymańska, Iwona B, Michler, Johann, Utke, Ivo
Published in Nanomaterials (Basel, Switzerland) (06.08.2022)
Published in Nanomaterials (Basel, Switzerland) (06.08.2022)
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Journal Article
Multicomposite Nanostructured Hematite–Titania Photoanodes with Improved Oxygen Evolution: The Role of the Oxygen Evolution Catalyst
Bärtsch, Mario, Sarnowska, Marta, Krysiak, Olga, Willa, Christoph, Huber, Christian, Pillatsch, Lex, Reinhard, Sandra, Niederberger, Markus
Published in ACS omega (31.08.2017)
Published in ACS omega (31.08.2017)
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Journal Article
In Situ Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, Oxidation
Pillatsch, Lex, Kalácska, Szilvia, Maeder, Xavier, Michler, Johann
Published in Microscopy and microanalysis (01.02.2021)
Published in Microscopy and microanalysis (01.02.2021)
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Journal Article
Imaging of Light Elements at the Nanometer Scale using fibTOF
Riedo-Grimaudo, Valentine, Pillatsch, Lex, Whitby, James, Liu, Menglong, Broekmann, Peter
Published in Microscopy and microanalysis (22.07.2023)
Published in Microscopy and microanalysis (22.07.2023)
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Journal Article
Tracing the Cross‐Talk Phenomenon of Vinylethylene Carbonate to Unveil its Counterintuitive Influence as an Electrolyte Additive on High‐Voltage Lithium‐Ion Batteries
Pfeiffer, Felix, Griggio, Angela, Weiling, Matthias, Wang, Jian‐Fen, Reißig, Friederike, Peschel, Christoph, Pillatsch, Lex, Warrington, Stefan, Nowak, Sascha, Grimaudo, Valentine, Wright, Iain, Baghernejad, Masoud
Published in Advanced energy materials (01.10.2024)
Published in Advanced energy materials (01.10.2024)
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In situ atomic force microscopy depth-corrected 3-dimensional focused ion beam based time-of-flight secondary ion mass spectroscopy: spatial resolution, surface roughness, oxidation
Pillatsch, Lex, Kalácska, Szilvia, Maeder, Xavier, Michler, Johann
Published in arXiv.org (30.03.2020)
Published in arXiv.org (30.03.2020)
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