Study and optimisation of SIMS performed with He+ and Ne+ bombardment
Pillatsch, L., Vanhove, N., Dowsett, D., Sijbrandij, S., Notte, J., Wirtz, T.
Published in Applied surface science (01.10.2013)
Published in Applied surface science (01.10.2013)
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Journal Article
Comparison of silicon and 4H silicon carbide patterning using focused ion beams
Veerapandian, S.K.P., Beuer, S., Rumler, M., Stumpf, F., Thomas, K., Pillatsch, L., Michler, J., Frey, L., Rommel, M.
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (15.12.2015)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (15.12.2015)
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Journal Article
Towards SIMS on the Helium Ion Microscope: Detection Limits and Experimental Results on the ORION
Dowsett, D., Pillatsch, L., Vanhove, N., Wirtz, T., Sijbrandij, S., Notte, J.
Published in Microscopy and microanalysis (01.08.2013)
Published in Microscopy and microanalysis (01.08.2013)
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Journal Article
SIMS using negative primary ion bombardment
Pillatsch, L., Wirtz, T., Migeon, H.-N., Scherrer, H.
Published in Surface and interface analysis (01.06.2010)
Published in Surface and interface analysis (01.06.2010)
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Journal Article
Towards Secondary Ion Mass Spectrometry On The Helium Ion Microscope
Wirtz, T., Pillatsch, L., Vanhove, N., Dowsett, D., Sijbrandij, S., Notte, J.
Published in Microscopy and microanalysis (01.07.2012)
Published in Microscopy and microanalysis (01.07.2012)
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Journal Article