Temporal versus Spatial Observability in Model-Based Diagnosis
Pietersma, J., van Gemund, A.J.C.
Published in 2006 IEEE International Conference on Systems, Man and Cybernetics (01.10.2006)
Published in 2006 IEEE International Conference on Systems, Man and Cybernetics (01.10.2006)
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Conference Proceeding
Automated Fault Diagnosis in Embedded Systems
Zoeteweij, Peter, Pietersma, Jurryt, Abreu, Rui, Feldman, Alexander, van Gemund, Arjan J.C.
Published in 2008 Second International Conference on Secure System Integration and Reliability Improvement (01.07.2008)
Published in 2008 Second International Conference on Secure System Integration and Reliability Improvement (01.07.2008)
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Conference Proceeding
A best student paper award winner at IEEE AUTOTESTCON 2005
PIETERSMA, Jurryt, VAN GEMUND, Arjan J. C, BOS, André
Published in IEEE instrumentation & measurement magazine (2007)
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Published in IEEE instrumentation & measurement magazine (2007)
Magazine Article