ESD design automation & methodology to prevent CDM failures in 130 & 90 nm ASIC design systems
Brennan, Ciaran J., Kozhaya, Joseph, Proctor, Robert, Sloan, Jeffrey, Chang, Shunhua, Sundquist, James, Lowe, Terry, Picozzi, David
Published in Journal of electrostatics (01.02.2006)
Published in Journal of electrostatics (01.02.2006)
Get full text
Journal Article
ESD design automation & methodology to prevent CDM failures in 130 & 90nm ASIC design systems
Brennan, Ciaran J., Kozhaya, Joseph, Proctor, Robert, Sloan, Jeffrey, Chang, Shunhua, Sundquist, James, Lowe, Terry, Picozzi, David
Published in Journal of electrostatics (01.02.2006)
Published in Journal of electrostatics (01.02.2006)
Get full text
Journal Article
CDM failure modes in a 130nm ASIC technology
Brennan, C.J., Sloan, J., Picozzi, D.
Published in 2004 Electrical Overstress/Electrostatic Discharge Symposium (01.09.2004)
Published in 2004 Electrical Overstress/Electrostatic Discharge Symposium (01.09.2004)
Get full text
Conference Proceeding