XPS and SEM/STEM Characterization of Silver Nanoparticles Formed from the X-ray-Induced and Thermal Reduction of Silver Behenate
Strohmeier, BR, Bunker, KL, Lopano, CL, Marquis, JP, Piasecki, JD, Bennethum, KE, White, RG, Nunney, T, Lee, RJ
Published in Microscopy and microanalysis (01.07.2009)
Published in Microscopy and microanalysis (01.07.2009)
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Journal Article
Automated XPS Analysis of Passivated Stainless Steel to the SEMI Standard
White, RG, Nunney, TS, Strohmeier, BR, Piasecki, JD, Lee, RJ
Published in Microscopy and microanalysis (01.07.2010)
Published in Microscopy and microanalysis (01.07.2010)
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Journal Article
XPS and FESEM/STEM Surface Characterization of Activated Carbon, Carbon Black, and Carbon Nanotubes
Strohmeier, BR, Piasecki, JD, Bunker, KL, Sturgeon, JL, Stitch, BA, Marquis, JP
Published in Microscopy and microanalysis (01.07.2010)
Published in Microscopy and microanalysis (01.07.2010)
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Journal Article