Embedded at-speed testing schemes with low overhead for high speed digital circuits on multi-chip modules
Maier, C.A., Greub, H., Philhower, B., Steidl, S., Garg, A., Ernest, M., Carlough, S., Campbell, P., McDonald, J.F.
Published in 1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon (1996)
Published in 1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon (1996)
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