Single-insertion temperature testing of semiconductor ICs
Pfahnl, A.C., Muller, L.A., Cochran, P.
Published in IEEE transactions on electronics packaging manufacturing (01.10.2000)
Published in IEEE transactions on electronics packaging manufacturing (01.10.2000)
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Journal Article
Optimized desoak system for IC panel test handlers
Pfahnl, A.C., Dunn, J., Muller, L.A.
Published in IEEE transactions on electronics packaging manufacturing (01.04.2002)
Published in IEEE transactions on electronics packaging manufacturing (01.04.2002)
Get full text
Journal Article
Single-insertion temperature testing of semiconductor ICs
Pfahnl, A.C., Muller, L.A., Cochran, P.
Published in IEEE transactions on electronics packaging manufacturing (01.10.2000)
Published in IEEE transactions on electronics packaging manufacturing (01.10.2000)
Get full text
Journal Article
Rackmount Liquid Cooler
Pfahnl, A.C.
Published in Thermal and Thermomechanical Proceedings 10th Intersociety Conference on Phenomena in Electronics Systems, 2006. ITHERM 2006 (2006)
Published in Thermal and Thermomechanical Proceedings 10th Intersociety Conference on Phenomena in Electronics Systems, 2006. ITHERM 2006 (2006)
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Conference Proceeding