by Vanhoucke, T., Kuindersma, P.I., Peters, W.C.M., Zieren, V., Donkers, J.J.T.M., Kramer, M.C.J.C.M., Hurkx, G.A.M.
Published in 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (01.10.2008)

by Kuindersma, P.I., Hoang, T., Schmitz, J., Vijayaraghavan, M.N., Dijkstra, M., van Noort, W., Vanhoucke, T., Peters, W.C.M., Kramer, M.C.J.
Published in 2008 5th IEEE International Conference on Group IV Photonics (01.09.2008)

by Tuinhout, H.P., Bretveld, A., Peters, W.C.M.
Published in International Conference on Microelectronic Test Structures, 2003 (2003)

by Tuinhout, H.P., Peters, W.C.M.
Published in ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) (1998)

by Tuinhout, H.P., Bretveld, A., Peters, W.C.M.
Published in Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) (2004)