Mask inspection of a semiconductor specimen
Cohen, Boaz, Shkalim, Ariel, Chereshnya, Alexander, Cohen, Oren Shmuel, Ovechkin, Vladimir, Petel, Ori, Madmon, Ronen, Bal, Evgeny
Year of Publication 14.05.2024
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Year of Publication 14.05.2024
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MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN
MADMON, Ronen, BAL, Evgeny, PETEL, Ori, OVECHKIN, Vladimir, COHEN, Oren Shmuel, SHKALIM, Ariel, COHEN, Boaz, CHERESHNYA, Alexander
Year of Publication 11.08.2022
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Year of Publication 11.08.2022
Patent
Mask inspection of a semiconductor specimen
Cohen, Boaz, Shkalim, Ariel, Chereshnya, Alexander, Cohen, Oren Shmuel, Ovechkin, Vladimir, Petel, Ori, Madmon, Ronen, Bal, Evgeny
Year of Publication 31.05.2022
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Year of Publication 31.05.2022
Patent
MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN
MADMON, Ronen, BAL, Evgeny, PETEL, Ori, OVECHKIN, Vladimir, COHEN, Oren Shmuel, SHKALIM, Ariel, COHEN, Boaz, CHERESHNYA, Alexander
Year of Publication 11.03.2021
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Year of Publication 11.03.2021
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