by Peschot, A., Poulain, C., Souchon, F., Charvet, P.-L., Bonifaci, N., Lesaint, O.
Published in Microelectronics and reliability (01.09.2012)

by Poulain, C., Peschot, A., Vincent, M., Bonifaci, N.
Published in 2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) (01.09.2011)

by Peschot, A., Vincent, M., Poulain, C., Mariolle, D., Houzé, F., Delamare, J.
Published in Sensing and Imaging: An International Journal (01.12.2015)

by Peschot, A., Poulain, C., Bonifaci, N., Lesaint, O.
Published in 2012 IEEE 58th Holm Conference on Electrical Contacts (Holm) (01.09.2012)

by Peschot, A., Poulain, C., Sibuet, H., Souchon, F., Bonifaci, N., Lesaint, O.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)

by Poulain, C, Jourdan, G, Peschot, A, Mandrillon, V
Published in 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts (01.10.2010)