by Serrano, J. A., Gines, A. J., Peralias, E.
Published in 2020 IEEE International Symposium on Circuits and Systems (ISCAS) (01.10.2020)

by Jalón, M A, Rueda, A, Peralías, E
Published in Electronics letters (26.03.2009)

by Gines, A. J., Peralias, E. J., Rueda, A.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.10.2017)

by JALON, M. A, RUEDA, A, PERALIAS, E
Published in Electronics letters (2009)

by Leger, G., Peralias, E.J., Rueda, A., Huertas, J.L.
Published in IEEE transactions on circuits and systems. I, Regular papers (01.01.2004)

by Lechuga, L.M., Tamayo, J., Álvarez, M., Carrascosa, L.G., Yufera, A., Doldán, R., Peralías, E., Rueda, A., Plaza, J.A., Zinoviev, K., Domínguez, C, Zaballos, A., Moreno, M., Martínez-A, C., Wenn, D., Harris, N., Bringer, C., Bardinal, V., Camps, T., Vergnenègre, C., Fontaine, C., Díaz, V., Bernad, A.
Published in Sensors and actuators. B, Chemical (25.10.2006)

by Jalon, M A, Peralias, E
Published in Journal of electronic testing (01.02.2010)

by Vazquez, D., Rueda, A., Huertas, J.L., Peralias, E.
Published in IEEE journal of solid-state circuits (01.07.1998)

by Gines, A. J., Peralias, E., Leger, G., Rueda, A., Renaud, G., Barragan, M. J., Mir, S.
Published in 2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) (01.07.2016)

by Gines, A. J., Peralias, E., Leger, G., Rueda, A., Renaud, G., Barragan, M. J., Mir, S.
Published in 2016 21th IEEE European Test Symposium (ETS) (01.05.2016)

by Fiorelli, Rafaella, Peralías, Eduardo, Méndez-Romero, Roberto, Rajabali, Mona, Kumar, Akash, Zahedinejad, Mohammad, Åkerman, Johan, Moradi, Farshad, Serrano-Gotarredona, Teresa, Linares-Barranco, Bernabé
Published in Electronics (Basel) (01.01.2023)

by Gines, A.J., Peralias, E., Rueda, A., Madrid, N.M., Seepold, R.
Published in Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe; 04-08 Mar. 2002 (2002)

by Barragan, Manuel J., Leger, G., Gines, A., Peralias, E., Rueda, A.
Published in Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 (01.03.2017)

by Peralías, E. J., Jalón, M. A., Rueda, A.
Published in VLSI Design (01.01.2008)

by Madrid, N.M., Peralias, E., Acosta, A., Rueda, A.
Published in Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001 (2001)

by Peralias, E., Rueda, A., Huertas, J.L.
Published in Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125) (1997)

by Ginés, A J, Doldán, R, Barragán, M J, Rueda, A, Peralias, E
Published in 2010 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2010)

by Peralias, E., Rueda, A., Prieto, J.A., Huertas, J.L.
Published in Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) (1998)

by Prieto, J.A., Rueda, A., Grout, I., Peralias, E., Huertas, J.L., Richardson, A.M.D.
Published in Proceedings Design, Automation and Test in Europe (1998)

by Doldan, R., Gines, A. J., Peralias, E., Rueda, A.
Published in 2012 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2012)