2D Materials in the BEOL
Naylor, C. H., Maxey, K., Jezewski, C., O'Brien, K. P., Penumatcha, A. V., Kavrik, M. S., Agrawal, B., Littlefield, C. V., Lux, J., Barley, B., Weber, J. R., Gupta, A. Sen, Dorow, C. J., Arefin, N., King, S., Chebiam, R., Plombon, J., Clendenning, S. B., Avci, U. E., Kobrinsky, M., Metz, M.
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)
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Conference Proceeding
Limitations of the High - Low C - V Technique for MOS Interfaces With Large Time Constant Dispersion
Penumatcha, A. V., Swandono, S., Cooper, J. A.
Published in IEEE transactions on electron devices (01.03.2013)
Published in IEEE transactions on electron devices (01.03.2013)
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Journal Article
Reliability Assessment of Double-Gated Wafer-Scale MoS2 Field Effect Transistors through Hysteresis and Bias Temperature Instability Analyses
Provias, A., Knobloch, T., Kitamura, A., O'Brien, K. P., Dorow, C. J., Waldhoer, D., Stampfer, B., Penumatcha, A. V., Lee, S., Ramamurthy, R., Clendenning, S., Waltl, M., Avci, U., Grasser, T.
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
Published in 2023 International Electron Devices Meeting (IEDM) (09.12.2023)
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Conference Proceeding