Tunneling Junction as Cold Source: Toward Steep-Slope Field-Effect Transistors Based on Monolayer MoS2
Wang, Qianwen, Sang, Pengpeng, Wang, Fei, Wei, Wei, Chen, Jiezhi
Published in IEEE transactions on electron devices (01.09.2021)
Published in IEEE transactions on electron devices (01.09.2021)
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Journal Article
Two-Dimensional Silicon Atomic Layer Field-Effect Transistors: Electronic Property, Metal-Semiconductor Contact, and Device Performance
Sang, Pengpeng, Wang, Qianwen, Wei, Wei, Tai, Lu, Zhan, Xuepeng, Li, Yuan, Chen, Jiezhi
Published in IEEE transactions on electron devices (01.04.2022)
Published in IEEE transactions on electron devices (01.04.2022)
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Journal Article
Imprint-Correlated Retention Loss in Hf₀.₅Zr₀.₅O₂ Ferroelectric Thin Film Through Wide-Temperature Characterizations
Li, Xiaopeng, Tai, Lu, Sang, Pengpeng, Dou, Xiaoyu, Zhan, Xuepeng, Xu, Hao, Wang, Xiaolei, Wu, Jixuan, Chen, Jiezhi
Published in IEEE transactions on electron devices (01.09.2024)
Published in IEEE transactions on electron devices (01.09.2024)
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Journal Article
Toward Low-Thermal-Budget Processing in Ferroelectric Hf0.5Zr0.5O2 Thin Films by Ozone Interface Oxidation
Tai, Lu, Wei, Wei, Jiang, Pengfei, Sang, Pengpeng, Li, Xiaopeng, Zhao, Guoqing, Dou, Xiaoyu, Zhan, Xuepeng, Luo, Qing, Wu, Jixuan, Chen, Jiezhi
Published in IEEE electron device letters (01.12.2023)
Published in IEEE electron device letters (01.12.2023)
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Journal Article
In-Depth Investigation of Seed Layer Engineering in Ferroelectric Hf0.5Zr0.5O2 Film: Wakeup-Free Achievement and Reliability Mechanisms
Li, Xiaopeng, Wu, Jixuan, Lu, Tai, Dou, Xiaoyu, Pengpeng Sang, Xu, Hao, Zhan, Xuepeng, Wang, Xiaolei, Chen, Jiezhi
Published in IEEE transactions on electron devices (01.02.2024)
Published in IEEE transactions on electron devices (01.02.2024)
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Journal Article
Significant Reliability Improvement by Inducing Dual Atomic-Thin Titanium Intercalation Layers in Hf0.5Zr0.5O2 Films
Tai, Lu, Wei, Wei, Sang, Pengpeng, Li, Xiaopeng, Zhao, Guoqing, Jiang, Pengfei, Yuan, Peng, Luo, Qing, Zhan, Xuepeng, Wu, Jixuan, Chen, Jiezhi
Published in IEEE electron device letters (01.05.2023)
Published in IEEE electron device letters (01.05.2023)
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Journal Article
Impact of Program-Erase Operation Intervals at Different Temperatures on 3D Charge-Trapping Triple-Level-Cell NAND Flash Memory Reliability
Zheng, Xuesong, Wu, Yifan, Dong, Haitao, Liu, Yizhi, Sang, Pengpeng, Xiao, Liyi, Zhan, Xuepeng
Published in Micromachines (Basel) (23.08.2024)
Published in Micromachines (Basel) (23.08.2024)
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Journal Article
Organic single‐crystal light‐emitting transistors with external quantum efficiency over 20
Deng, Jian, Zhang, Zejian, Sang, Pengpeng, Yin, Shujun, Zhang, Shitong, Li, Yuan, Yang, Bing, Gu, Cheng, Ma, Yuguang
Published in Aggregate (Hoboken) (01.08.2023)
Published in Aggregate (Hoboken) (01.08.2023)
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Journal Article
Opto-Electronic Monolayer ZnO Memristor Produced via Low Temperature Atomic Layer Deposition
Mei, Junyao, Chen, Bo, Sang, Pengpeng, Wu, Jixuan, Zhan, Xuepeng, Chen, Jiezhi
Published in 2023 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA) (27.10.2023)
Published in 2023 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA) (27.10.2023)
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Conference Proceeding
Simulation for the Feasibility of IGZO Channel in 3D Vertical FeFET Memory Based on TCAD
Du, Zhichao, Sun, Chuanxue, Dou, Xiaoyu, Sang, Pengpeng, Zhan, Xuepeng, Jin, Chengji, Wu, Jixuan, Chen, Jiezhi
Published in 2023 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA) (27.10.2023)
Published in 2023 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA) (27.10.2023)
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Conference Proceeding
Error Bits Recovering in 3D NAND Flash Memory: A Novel State-Shift Re-Program (SRP) Scheme
Zhao, Xiaohuan, Yang, Shaoqi, Xie, Kenie, Feng, Yang, Wang, Qianwen, Sang, Pengpeng, Zhan, Xuepeng, Wu, Jixuan, Chen, Jiezhi
Published in 2023 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA) (27.10.2023)
Published in 2023 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA) (27.10.2023)
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Conference Proceeding
Molecular simulation of CO2/CH4 adsorption in brown coal: Effect of oxygen-, nitrogen-, and sulfur-containing functional groups
Dang, Yong, Zhao, Lianming, Lu, Xiaoqing, Xu, Jing, Sang, Pengpeng, Guo, Sheng, Zhu, Houyu, Guo, Wenyue
Published in Applied surface science (30.11.2017)
Published in Applied surface science (30.11.2017)
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Journal Article
Van der Waals Heterostructure Contact Strategy for Barrier‐Free 2D Complementary Transistors
Sang, Pengpeng, Wang, Qianwen, Wang, Hai, Wu, Jixuan, Zhan, Xuepeng, Li, Dechun, Chen, Jiezhi
Published in Advanced functional materials (24.09.2024)
Published in Advanced functional materials (24.09.2024)
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Journal Article
Organic steep-slope nano-FETs: A rational design based on two-dimensional covalent-organic frameworks
Gong, Xiangxin, Xu, Lijun, Sang, Pengpeng, Li, Yuan, Chen, Jiezhi
Published in Organic electronics (01.01.2022)
Published in Organic electronics (01.01.2022)
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Journal Article
The Oxidation of Methanol on PtRu(111): A Periodic Density Functional Theory Investigation
Zhao, Lianming, Wang, Shengping, Ding, Qiuyue, Xu, Wenbin, Sang, Pengpeng, Chi, Yuhua, Lu, Xiaoqing, Guo, Wenyue
Published in Journal of physical chemistry. C (03.09.2015)
Published in Journal of physical chemistry. C (03.09.2015)
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Journal Article