Effect of SET temperature on data retention performances of HfO2-based RRAM cells
Cabout, T., Vianello, E., Jalaguier, E., Grampeix, H., Molas, G., Blaise, P., Cueto, O., Guillermet, M., Nodin, J. F., Pemiola, L., Blonkowski, S., Jeannot, S., Denorme, S., Candelier, P., Bocquet, M., Muller, C.
Published in 2014 IEEE 6th International Memory Workshop (IMW) (01.05.2014)
Published in 2014 IEEE 6th International Memory Workshop (IMW) (01.05.2014)
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Conference Proceeding
Phase Change Memory advanced electrical characterization for conventional and alternative applications
Toffoli, A., Suri, M., Perniola, L., Persico, A., Jahan, C., Nodin, J. F., Sousa, V., DeSalvo, B., Reimbold, G.
Published in 2012 IEEE International Conference on Microelectronic Test Structures (01.03.2012)
Published in 2012 IEEE International Conference on Microelectronic Test Structures (01.03.2012)
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Conference Proceeding
On the impact of OxRAM-based synapses variability on convolutional neural networks performance
Garbin, D., Vianello, E., Bichler, O., Azzaz, M., Rafhay, Q., Candelier, P., Gamrat, C., Ghibaudo, G., DeSalvo, B., Perniola, L.
Published in Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH´15) (01.07.2015)
Published in Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH´15) (01.07.2015)
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Conference Proceeding