Comparison of mixed anion, InAsyP1−y and mixed cation, InxAl1−xAs metamorphic buffers grown by molecular beam epitaxy on (100) InP substrates
Hudait, M. K., Lin, Y., Palmisiano, M. N., Tivarus, C., Pelz, J. P., Ringel, S. A.
Published in Journal of applied physics (15.04.2004)
Published in Journal of applied physics (15.04.2004)
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Spatial correlation of the EC-0.57 eV trap state with edge dislocations in epitaxial n-type gallium nitride
Galiano, K., Deitz, J. I., Carnevale, S. D., Gleason, D. A., Paul, P. K., Zhang, Z., McSkimming, B. M., Speck, J. S., Ringel, S. A., Grassman, T. J., Arehart, A. R., Pelz, J. P.
Published in Journal of applied physics (14.06.2018)
Published in Journal of applied physics (14.06.2018)
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Characterization of individual threading dislocations in GaN using ballistic electron emission microscopy
Im, H J, Ding, Y, Pelz, J P, Heying, B, Speck, J S
Published in Physical review letters (03.09.2001)
Published in Physical review letters (03.09.2001)
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Correlative Defect Characterization in Semiconductors via Electron Channeling Contrast Imaging and Scanning Deep Level Transient Spectroscopy
Grassman, T. J., Galiano, K., Deitz, J. I., Carnevale, S. D., Gleason, D. A., Zhang, Z., Ringel, S. A., Arehart, A. R., Pelz, J. P.
Published in Microscopy and microanalysis (01.08.2018)
Published in Microscopy and microanalysis (01.08.2018)
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Enhanced terrace stability for preparation of step-free Si(001)-(2 x 1) surfaces
Nielsen, J F, Pelz, J P, Hibino, H, Hu, C W, Tsong, I S
Published in Physical review letters (24.09.2001)
Published in Physical review letters (24.09.2001)
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Scanning tunneling microscopy study of cleaning procedures for SiGe(001) surfaces
Jones, D.E., Pelz, J.P., Xie, Y.H., Silverman, P.J., Fitzgerald, E.A.
Published in Surface science (01.11.1995)
Published in Surface science (01.11.1995)
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Direct nm-Scale Spatial Mapping of Traps in CIGS
Paul, P. K., Cardwell, D. W., Jackson, C. M., Galiano, K., Aryal, K., Pelz, J. P., Marsillac, S., Ringel, S. A., Grassman, T. J., Arehart, A. R.
Published in IEEE journal of photovoltaics (01.09.2015)
Published in IEEE journal of photovoltaics (01.09.2015)
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