Search Results - "Pei-Ying Hsueh" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Physical-aware systematic multiple defect diagnosis

Physical-aware systematic multiple defect diagnosis

by Chen, Po-Juei, Che, Chieh-Chih, Li, James C.-M, Kuo, Shuo-Fen, Hsueh, Pei-Ying, Kuo, Chun-Yi, Lee, Jih-Nung
Published in Chronic diseases and translational medicine (01.09.2014)

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Journal Article

Removal of binary azo dyes from water by UV-irradiated degradation in TiO2 suspensions

Removal of binary azo dyes from water by UV-irradiated degradation in TiO2 suspensions

by JUANG, Ruey-Shin, LIN, Su-Hsia, HSUEH, Pei-Ying
Published in Journal of hazardous materials (15.10.2010)

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Journal Article

Divide and conquer diagnosis for multiple defects

Divide and conquer diagnosis for multiple defects

by Shih-Min Chao, Po-Juei Chen, Jing-Yu Chen, Po-Hao Chen, Ang-Feng Lin, Li, James C.-M, Pei-Ying Hsueh, Chun-Yi Kuo, Ying-Yen Chen, Jih-Nung Li
Published in 2014 International Test Conference (01.10.2014)

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Conference Proceeding

Case study of yield learning through in-house flow of volume diagnosis

Case study of yield learning through in-house flow of volume diagnosis

by Pei-Ying Hsueh, Shuo-Fen Kuo, Chao-Wen Tzeng, Jih-Nung Lee, Chi-Feng Wu
Published in 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) (01.04.2013)

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Conference Proceeding

Removal of binary azo dyes from water by UV-irradiated degradation in TiO 2 suspensions

Removal of binary azo dyes from water by UV-irradiated degradation in TiO 2 suspensions

by Juang, Ruey-Shin, Lin, Su-Hsia, Hsueh, Pei-Ying
Published in Journal of hazardous materials (2010)

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Journal Article

Test device for testing on-chip clock controller having debug function

Test device for testing on-chip clock controller having debug function

by YUNG, SHENG-PING, HSUEH, PEI-YING
Year of Publication 11.07.2024

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Patent

Test device for testing on-chip clock controller having debug function

Test device for testing on-chip clock controller having debug function

by YUNG, SHENG-PING, HSUEH, PEI-YING
Year of Publication 25.04.2024

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Patent

Isolation circuit having test mechanism and test method thereof

Isolation circuit having test mechanism and test method thereof

by Liu, Kuo-Kai, Hsueh, Pei-Ying, Cheng, Chih-Chieh
Year of Publication 03.10.2023

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Patent

Isolation circuit having test mechanism and test method thereof

Isolation circuit having test mechanism and test method thereof

by LIU, KUO-KAI, CHENG, CHIHIEH, HSUEH, PEI-YING
Year of Publication 21.04.2022

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Patent

Chip and testing method thereof

Chip and testing method thereof

by Kuo, Chun-Yi, Hsueh, Pei-Ying, Yung, Sheng-Ping
Year of Publication 29.03.2022

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Patent

Test device for testing on-chip clock controller having debug function

Test device for testing on-chip clock controller having debug function

by YUNG, SHENG-PING, HSUEH, PEI-YING
Year of Publication 01.05.2024

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Patent

CHIP AND TESTING METHOD THEREOF

CHIP AND TESTING METHOD THEREOF

by YUNG, Sheng-Ping, HSUEH, Pei-Ying, KUO, Chun-Yi
Year of Publication 01.04.2021

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Patent

Test device for testing on-chip clock controller having debug function

Test device for testing on-chip clock controller having debug function

by YUNG, SHENG-PING, HSUEH, PEI-YING
Year of Publication 21.08.2023

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Patent

Chip

Chip

by Kuo, Chun-Yi, Hsueh, Pei-Ying, Yung, Sheng-Ping
Year of Publication 30.06.2020

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Patent

CHIP

CHIP

by Kuo, Chun-Yi, Hsueh, Pei-Ying, Yung, Sheng-Ping
Year of Publication 23.04.2020

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Patent

Isolation circuit having test mechanism and test method thereof

Isolation circuit having test mechanism and test method thereof

by LIU, KUO-KAI, CHENG, CHIHIEH, HSUEH, PEI-YING
Year of Publication 01.05.2022

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Patent

Multiple defect diagnosis method and machine readable media

Multiple defect diagnosis method and machine readable media

by Che, Chieh-Chih, Kuo, Chun-Yi, Hsueh, Pei-Ying, Li, Chien-Mo
Year of Publication 29.05.2018

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Patent

Isolation circuit having test mechanism and test method thereof

Isolation circuit having test mechanism and test method thereof

by LIU, KUO-KAI, CHENG, CHIHIEH, HSUEH, PEI-YING
Year of Publication 21.03.2021

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Patent

Chip and testing method thereof

Chip and testing method thereof

by YUNG, SHENG-PING, KUO, CHUN-YI, HSUEH, PEI-YING
Year of Publication 01.04.2021

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Patent

Chip and testing method thereof

Chip and testing method thereof

by KUO, CHUN YI, HSUEH, PEI YING, YUNG, SHENG PING
Year of Publication 11.10.2020

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Patent