Anomalous behavior of surface leakage currents in heavily doped gated-diodes
Hurkx, F., Peek, H.L., Slotboom, J.W., Windgassen, R.A.
Published in IEEE transactions on electron devices (01.12.1993)
Published in IEEE transactions on electron devices (01.12.1993)
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Journal Article
A 2.2 M pixel FT-CCD imager according to the Eureka HDTV standard
Theuwissen, A.J.P., Peek, H.L., van de Steeg, M.J.H., Boesten, R.M.G., Hartog, P.B., Kokshorn, A.L., De Koning, E.A., Oppers, J.M.A.M., Vledder, F.F., Centen, P.G.M., Blom, H., Haar, W.
Published in IEEE transactions on electron devices (01.09.1993)
Published in IEEE transactions on electron devices (01.09.1993)
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Journal Article
The tacking CCD: a new CCD concept
Bakker, J.G.C., Esser, L.J.M., Peek, H.L., Sweeney, C.J., Kokshoorn, A.L., Theuwissen, A.J.P.
Published in IEEE transactions on electron devices (01.05.1991)
Published in IEEE transactions on electron devices (01.05.1991)
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Journal Article
A 35-mm format 11 M pixel full-frame CCD for professional digital still imaging
Bosiers, J.T., Dillen, B.G.M., Draijer, C., Kleimann, A.C., Polderdijk, F.J., de Wolf, M.A.R.C., Klaassens, W., Theuwissen, A.J.P., Peek, H.L., Folkerts, H.O.
Published in IEEE transactions on electron devices (01.01.2003)
Published in IEEE transactions on electron devices (01.01.2003)
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Journal Article
Frame transfer CCDs for digital still cameras: concept, design, and evaluation
Bosiers, J.T., Kleimann, A.C., van Kuijk, H.C., Le Cam, L., Peek, H.L., Maas, J.P., Theuwissen, A.J.P.
Published in IEEE transactions on electron devices (01.03.2002)
Published in IEEE transactions on electron devices (01.03.2002)
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Journal Article
A frame-transfer CCD color imager with vertical antiblooming
van de Steeg, M.J.H., Peek, H.L., Bakker, J.G.C., Pals, J.A., Dillen, B.G.M.H., Oppers, J.M.A.M.
Published in IEEE transactions on electron devices (01.08.1985)
Published in IEEE transactions on electron devices (01.08.1985)
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Journal Article
High Density Frame Transfer Image Sensor
Beck, G. A., Collet, M. G., Gils, J. A. A. van, Klinkhamer, A. J., Peek, H. L., Ruis, W. N. J., Santen, J. G. van, Smit, T. F., Vandormael, G. T. J.
Published in Japanese Journal of Applied Physics (01.01.1983)
Published in Japanese Journal of Applied Physics (01.01.1983)
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Journal Article
An EEPROM for microprocessors and custom logic
Cuppens, R., Hartgring, C.D., Verwey, J.F., Peek, H.L., Vollebragt, F.A.H., Devens, E.G.M., Sens, I.A.
Published in IEEE journal of solid-state circuits (01.04.1985)
Published in IEEE journal of solid-state circuits (01.04.1985)
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Journal Article
CCD imagers for broadcast applications
Stoldt, H., Theuwissen, A.J.P., Vledder, F.F., Centen, P.G.M., Mierop, A., Kleimann, A.C.M., Peek, H.L., Verbugt, D.W.E., Hartog, P.B., de Gruyter, R.H.S.
Published in International Electron Devices Meeting. Technical Digest (1996)
Published in International Electron Devices Meeting. Technical Digest (1996)
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Conference Proceeding
An S-VHS compatible 1/3" color FT-CCD imager with low dark current by surface pinning
Bosiers, J.T., Roks, E., Peek, H.L., Kleimann, A.C., Van der Sijde, A.G.
Published in IEEE transactions on electron devices (01.08.1995)
Published in IEEE transactions on electron devices (01.08.1995)
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Journal Article
A 2/3-in 1187(H)x 581(V) S-VHS-compatible frame-transfer CCDfor ESP and movie mode
Bosiers, J T, Kleimann, A C, Dillen, B G, Peek, H L, Kokshoorn, A L, Daemen, N J, van der Sijde, A G, van Gaal, L T
Published in IEEE transactions on electron devices (01.05.1991)
Published in IEEE transactions on electron devices (01.05.1991)
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Journal Article
Anomalous behaviour of surface leakage currents in heavily-doped MOS structures
Hurkx, Peek, Slotboom, Windgassen
Published in 1992 International Technical Digest on Electron Devices Meeting (1992)
Published in 1992 International Technical Digest on Electron Devices Meeting (1992)
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Conference Proceeding