Electrical characterization of stacked SOI nanowires at low temperatures
Rodrigues, Jaime C., Mariniello, Genaro, Cassé, Mikael, Barraud, Sylvain, Vinet, Maud, Faynot, Olivier, Pavanello, Marcelo A.
Published in Solid-state electronics (01.05.2022)
Published in Solid-state electronics (01.05.2022)
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Journal Article
Comprehensive Evaluation of Junctionless and Inversion-Mode Nanowire MOSFETs Performance at High Temperatures
Prates, Rhaycen R., Barraud, Sylvain, Casse, Mikael, Vinet, Maud, Faynot, Olivier, Pavanello, Marcelo A.
Published in IEEE journal of the Electron Devices Society (2024)
Published in IEEE journal of the Electron Devices Society (2024)
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Journal Article
Pragmatic evaluation of fin height and fin width combined variation impact on the performance of junctionless transistors
Ribeiro, Thales Augusto, Cerdeira, Antonio, Estrada, Magali, Barraud, Sylvain, Pavanello, Marcelo Antonio
Published in Journal of computational electronics (01.06.2022)
Published in Journal of computational electronics (01.06.2022)
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Journal Article
Compact modeling of triple gate junctionless MOSFETs for accurate circuit design in a wide temperature range
Pavanello, Marcelo Antonio, Cerdeira, Antonio, Doria, Rodrigo Trevisoli, Ribeiro, Thales Augusto, Ávila-Herrera, Fernando, Estrada, Magali
Published in Solid-state electronics (01.09.2019)
Published in Solid-state electronics (01.09.2019)
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Journal Article
Effect of the back bias on the analog performance of standard FD and UTBB transistors-based self-cascode structures
Doria, Rodrigo T, Flandre, Denis, Trevisoli, Renan, de Souza, Michelly, Pavanello, Marcelo A
Published in Semiconductor science and technology (01.09.2017)
Published in Semiconductor science and technology (01.09.2017)
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Journal Article
A physically-based threshold voltage definition, extraction and analytical model for junctionless nanowire transistors
Trevisoli, Renan Doria, Doria, Rodrigo Trevisoli, de Souza, Michelly, Pavanello, Marcelo Antonio
Published in Solid-state electronics (01.12.2013)
Published in Solid-state electronics (01.12.2013)
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Journal Article
Conference Proceeding
Cryogenic Operation of Junctionless Nanowire Transistors
de Souza, M., Pavanello, M. A., Trevisoli, R. D., Doria, R. T., Colinge, J.
Published in IEEE electron device letters (01.10.2011)
Published in IEEE electron device letters (01.10.2011)
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Journal Article
Electrical characterization of vertically stacked p-FET SOI nanowires
Cardoso Paz, Bruna, Cassé, Mikaël, Barraud, Sylvain, Reimbold, Gilles, Vinet, Maud, Faynot, Olivier, Antonio Pavanello, Marcelo
Published in Solid-state electronics (01.03.2018)
Published in Solid-state electronics (01.03.2018)
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Journal Article
Approximate analytical expression for the tersminal voltage in multi-exponential diode models
Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Terán Barrios, Alberto, Muci, Juan, de Souza, Michelly, Pavanello, Marcelo A.
Published in Solid-state electronics (01.11.2013)
Published in Solid-state electronics (01.11.2013)
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Journal Article
Junctionless Multiple-Gate Transistors for Analog Applications
Doria, R. T., Pavanello, M. A., Trevisoli, R. D., de Souza, M., Chi-Woo Lee, Ferain, I., Akhavan, N. D., Ran Yan, Razavi, P., Ran Yu, Kranti, A., Colinge, J.
Published in IEEE transactions on electron devices (01.08.2011)
Published in IEEE transactions on electron devices (01.08.2011)
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Journal Article
Foreword Special Issue on Compact Modeling of Semiconductor Devices
Iniguez, Benjamin, Chauhan, Yogesh Singh, Mijalkovic, Slobodan, Xia, Kejun, Goo, Jung-Suk, Pavanello, Marcelo, Mierzwinski, Marek, Grabinski, Wladek
Published in IEEE journal of the Electron Devices Society (2020)
Published in IEEE journal of the Electron Devices Society (2020)
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Journal Article
An explicit multi-exponential model for semiconductor junctions with series and shunt resistances
Lugo-Muñoz, Denise, Muci, Juan, Ortiz-Conde, Adelmo, García-Sánchez, Francisco J., Souza, Michelly de, Pavanello, Marcelo A.
Published in Microelectronics and reliability (01.12.2011)
Published in Microelectronics and reliability (01.12.2011)
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Journal Article
High Temperature and Width Influence on the GIDL of Nanowire and Nanosheet SOI nMOSFETs
de Souza, Michelly, Cerdeira, Antonio, Estrada, Magali, Barraud, Sylvain, Casse, Mikael, Vinet, Maud, Faynot, Olivier, Pavanello, Marcelo Antonio
Published in IEEE journal of the Electron Devices Society (01.01.2023)
Published in IEEE journal of the Electron Devices Society (01.01.2023)
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Journal Article
Analysis of temperature variation influence on the analog performance of 45° rotated triple-gate nMuGFETs
Pavanello, Marcelo Antonio, Souza, Michelly de, Martino, Joao Antonio, Simoen, Eddy, Claeys, Cor
Published in Solid-state electronics (01.04.2012)
Published in Solid-state electronics (01.04.2012)
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Journal Article
Conference Proceeding