Single frame digital fringe projection profilometry for 3-D surface shape measurement
Paul Kumar, U., Somasundaram, U., Kothiyal, M.P., Krishna Mohan, N.
Published in Optik (Stuttgart) (01.01.2013)
Published in Optik (Stuttgart) (01.01.2013)
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Journal Article
Microscopic TV holography for MEMS deflection and 3-D surface profile characterization
Paul Kumar, U., Bhaduri, Basanta, Krishna Mohan, N., Kothiyal, M.P., Asundi, A.K.
Published in Optics and lasers in engineering (01.09.2008)
Published in Optics and lasers in engineering (01.09.2008)
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Journal Article
White light interferometry for surface profiling with a colour CCD
Kumar, U. Paul, Haifeng, Wang, Mohan, N. Krishna, Kothiyal, M.P.
Published in Optics and lasers in engineering (01.08.2012)
Published in Optics and lasers in engineering (01.08.2012)
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Journal Article
Two-wavelength micro-interferometry for 3-D surface profiling
Kumar, U. Paul, Bhaduri, Basanta, Kothiyal, M.P., Mohan, N. Krishna
Published in Optics and lasers in engineering (01.02.2009)
Published in Optics and lasers in engineering (01.02.2009)
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Journal Article
Red-Green-Blue wavelength interferometry and TV holography for surface metrology
Kumar, U. Paul, Mohan, N. Krishna, Kothiyal, M. P.
Published in Journal of optics (New Delhi) (01.12.2011)
Published in Journal of optics (New Delhi) (01.12.2011)
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Journal Article