CN13 Impact of AI clinical trial program on screening, matching, and enrollment of patients over 6 months
Shepard, D., Mallahan, S., Osterman, C., Skelly, D., Patnaude, E., Weiss, M., O’Neil, B.H., Rao, A., Abdulla, N.E., Zarzour, A., Sankhala, K. Kumar, Goldstein, M.G., Parsons, B., La Porte, P., Franzen, A.G., Cohen, E., Cooney, M.
Published in Annals of oncology (01.09.2024)
Published in Annals of oncology (01.09.2024)
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Journal Article
Compendia of radiation test results of integrated circuits
Layton, P., Patnaude, E., Williamson, G., Longden, L., Sloan, C.
Published in IEEE Radiation Effects Data Workshop, 2005 (2005)
Published in IEEE Radiation Effects Data Workshop, 2005 (2005)
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Conference Proceeding
TID performance degradation of high precision, 16-bit analog-to-digital converters
Layton, P., Williamson, G., Patnaude, E., Longden, L., Thibodeau, C., Kazak, B., Sloan, C.
Published in 2003 IEEE Radiation Effects Data Workshop (2003)
Published in 2003 IEEE Radiation Effects Data Workshop (2003)
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Conference Proceeding
Compendia of TID and SEE test results of space qualified integrated circuits
Layton, P., Williamson, G., Patnaude, E., Longden, L., Thibodeau, C., Kazak, B., Sloan, C.
Published in 2003 IEEE Radiation Effects Data Workshop (2003)
Published in 2003 IEEE Radiation Effects Data Workshop (2003)
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Conference Proceeding
Compendia of TID and SEE test results of integrated circuits
Layton, P., Williamson, G., Gilbert, C., Longden, L., Patnaude, E., Sloan, C.
Published in 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) (2004)
Published in 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) (2004)
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Conference Proceeding
Compendia of Radiation Test Results
Layton, P., Longden, L., Patnaude, E.
Published in 2007 IEEE Radiation Effects Data Workshop (01.07.2007)
Published in 2007 IEEE Radiation Effects Data Workshop (01.07.2007)
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Conference Proceeding
Compendia of Radiation Test Results of Integrated Circuits
Layton, P., Gilbert, C., Patnaude, E., Williamson, G., Longden, L., Sloan, C.
Published in 2006 IEEE Radiation Effects Data Workshop (01.07.2006)
Published in 2006 IEEE Radiation Effects Data Workshop (01.07.2006)
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Conference Proceeding
TID performance degradation of high precision, 16-bit analog-to-digital converters
Layton, P., Williamson, G., Patnaude, E., Longden, L., Thibodeau, C.
Published in Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003 (2003)
Published in Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003 (2003)
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Conference Proceeding
Evaluation of Reliability and Data Retention of an Irradiated Nonvolatile Memory
Layton, P., Longden, L., Patnaude, E.
Published in 2005 8th European Conference on Radiation and Its Effects on Components and Systems (01.09.2005)
Published in 2005 8th European Conference on Radiation and Its Effects on Components and Systems (01.09.2005)
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Conference Proceeding
Compendia of TID and see test results of space qualified integrated circuits
Lavton, P., Williamson, G., Patnaude, E., Longden, L., Thibodeau, C., Kazak, B., Sloan, C.
Published in Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003 (2003)
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Published in Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003 (2003)
Conference Proceeding
Leilão de dívida pública na Alemanha fracassa
Por Emese Bartha, Art Patnaude e Nick Cawley, Frankfurt, de
Published in The Wall Street Journal Americas (23.11.2011)
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Published in The Wall Street Journal Americas (23.11.2011)
Newspaper Article