Search Results - "Pathy, S. V." :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Logic BIST silicon debug and volume diagnosis methodology

Logic BIST silicon debug and volume diagnosis methodology

by Amyeen, M. E., Jayalakshmi, A., Venkataraman, S., Pathy, S. V., Tan, E. C.
Published in 2011 IEEE International Test Conference (01.09.2011)

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Conference Proceeding

Constructing and comparing selection indices for early growth traits in Saccharum spontaneum

Constructing and comparing selection indices for early growth traits in Saccharum spontaneum

by T. Lakshmi Pathy, V. Vinu, Adhini S. Pazhany and S. Karthigeyan
Published in Electronic journal of plant breeding (03.03.2022)

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Journal Article