High-frequency noise measurements on MOSFETs with channel-lengths in sub-100 nm regime
Patalay, P.R., Jindal, R.P., Shichijo, H., Martin, S., Fan-Chi Hou, Trombley, D.
Published in 2009 2nd International Workshop on Electron Devices and Semiconductor Technology (01.06.2009)
Published in 2009 2nd International Workshop on Electron Devices and Semiconductor Technology (01.06.2009)
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