Harnessing process variations for optimizing wafer-level probe-test flow
Ahmadi, Ali, Xanthopoulos, Constantinos, Nahar, Amit, Orr, Bob, Pas, Michael, Makris, Yiorgos
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
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Conference Proceeding
Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations
Ahmadi, Ali, Stratigopoulos, Haralampos G., Ke Huang, Nahar, Amit, Orr, Bob, Pas, Michael, Carulli, John M., Makris, Yiorgos
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2017)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2017)
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Journal Article
Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs
Ahmadi, Ali, Nahar, Amit, Orr, Bob, Past, Michael, Makris, Yiorgos
Published in 2016 IEEE 34th VLSI Test Symposium (VTS) (01.04.2016)
Published in 2016 IEEE 34th VLSI Test Symposium (VTS) (01.04.2016)
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Conference Proceeding
Journal Article
A machine learning approach to fab-of-origin attestation
Ahmadi, Ali, Bidmeshki, Mohammad-Mahdi, Nahar, Amit, Orr, Bob, Pas, Michael, Makris, Yiorgos
Published in 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2016)
Published in 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2016)
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Conference Proceeding
Yield prognosis for fab-to-fab product migration
Ahmadi, Ali, Ke Huang, Nahar, Amit, Orr, Bob, Pas, Michael, Carulli, John M., Makris, Yiorgos
Published in 2015 IEEE 33rd VLSI Test Symposium (VTS) (01.04.2015)
Published in 2015 IEEE 33rd VLSI Test Symposium (VTS) (01.04.2015)
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Conference Proceeding
Improvement of FinFET electrical characteristics by hydrogen annealing
Weize Xiong, Gebara, G., Zaman, J., Gostkowski, M., Nguyen, B., Smith, G., Lewis, D., Cleavelin, C.R., Wise, R., Shaofeng Yu, Pas, M., Tsu-Jae King, Colinge, J.P.
Published in IEEE electron device letters (01.08.2004)
Published in IEEE electron device letters (01.08.2004)
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Journal Article
CMOS Dual-Work-Function Engineering by Using Implanted Ni-FUSI
Chien-Ting Lin, Ramin, M., Pas, M., Wise, R., Yean-Kuen Fang, Che-Hua Hsu, Yao-Tsung Huang, Li-Wei Cheng, Ma, M.
Published in IEEE electron device letters (01.09.2007)
Published in IEEE electron device letters (01.09.2007)
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Journal Article
Data structures for semiconductor die packaging
Boduch, Joseph Anthony, Pas, Michael Francis, Orr, Robert Daniel, Chiu, Sandia You Ni
Year of Publication 19.05.2020
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Year of Publication 19.05.2020
Patent
Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion
Ahmadi, Ali, Stratigopoulos, Haralampos-G., Nahar, Amit, Orr, Bob, Pas, Michael, Makris, Yiorgos
Published in Proceedings of the IEEE/ACM International Conference on Computer-Aided Design (02.11.2015)
Published in Proceedings of the IEEE/ACM International Conference on Computer-Aided Design (02.11.2015)
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Conference Proceeding
Yield forecasting in fab-to-fab production migration based on Bayesian Model Fusion
Ahmadi, Ali, Stratigopoulos, Haralampos-G, Nahar, Amit, Orr, Bob, Pas, Michael, Makris, Yiorgos
Published in 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2015)
Published in 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2015)
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Conference Proceeding
Data Structures for Semiconductor Die Packaging
Boduch, Joseph Anthony, Pas, Michael Francis, Orr, Robert Daniel, Chiu, Sandia You Ni
Year of Publication 06.12.2018
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Year of Publication 06.12.2018
Patent