by Tanner, D.M., Parson, T.B., Corwin, A.D., Walraven, J.A., Wittwer, J.W., Boyce, B.L., Winzer, S.R.
Published in Microelectronics and reliability (01.09.2007)

by Tanner, D.M., Walraven, J.A., Dugger, M.T., Parson, T.B., Candelaria, S.A., Jenkins, M.W., Corwin, A.D., Ohlhausen, J.A., Huffman, E.M.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)