Real impact of dynamic operation stress during burn-in on DRAM retention time
Kim, I.-G., Choi, S.-K., Choi, J.-H., Park, J.-S.
Published in IEEE transactions on electron devices (01.04.2004)
Published in IEEE transactions on electron devices (01.04.2004)
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Journal Article
DRAM Reliability Degradation By Dynamic Operation Stress During Burn-In
Kim, Il-Gweon, Kim, Nam-Sung, Park, Joo-Seog
Published in Japanese Journal of Applied Physics (2003)
Published in Japanese Journal of Applied Physics (2003)
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Journal Article
Impact of Polymetal Gate Etch Post-Cleaning on Data Retention Time in Sub-micron DRAM Cells
Kim, Nam-Sung, Kim, Il-Gweon, Choy, Jun-Ho, Park, Joo-Seog
Published in Japanese Journal of Applied Physics (01.04.2002)
Published in Japanese Journal of Applied Physics (01.04.2002)
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Journal Article
Low-Damage Gate Etching with High Degree of Anisotropy in High-Density DRAM Cell
Kim, Il-Gweon, Kim, Nam-Sung, Park, Joo-Seog, Park, Dae-Young
Published in Japanese Journal of Applied Physics (01.04.2002)
Published in Japanese Journal of Applied Physics (01.04.2002)
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Journal Article
Suppression of Anomalous Edge Channel Effect for 0.15 µm DRAM Cell and Beyond
Kim, Il-Gweon, Choi, Se-Kyeong, Park, Joo-Seog
Published in Japanese Journal of Applied Physics (30.04.2003)
Published in Japanese Journal of Applied Physics (30.04.2003)
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Journal Article
Interlayer dielectric (ILD)-related edge channel effect in high density DRAM cell
KIM, Il-Gweon, KIM, Nam-Sung, CHOI, Se-Kyeong, YOUN, Tae-Un, JUNG, Hyuck-Chai, KWEON, Jae-Soon, CHUN, Young-Il, KIM, Wan-Soo, BONG, Myung-Jong, PARK, Joo-Seog
Published in Digest. International Electron Devices Meeting (2002)
Published in Digest. International Electron Devices Meeting (2002)
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Conference Proceeding
Real impact of W/WNx/Poly-Si gate stack in volume production of high density DRAM
Il-Gweon Kim, Nam-Sung Kim, Jun-Ho Choy, Byung-Hak Lee, Yong-Gue Sung, Jong-Hwan Kim, Jin-Hee Cho, Dong-Chan Kim, Kee-Soo Kim, Jo-Bong Choi, Se-Kyoung Choi, Young-Woo Kweon, Ho-Yup Kwon, Dae-Guy Park, Joo-Seog Park, Dae-Young Park
Published in International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) (2001)
Published in International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) (2001)
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Conference Proceeding
Impact of old age on clinical and angiographic characteristics of coronary artery spasm as assessed by acetylcholine provocation test
Choi, Woong Gil, Kim, Soo Hyun, Rha, Seung-Woon, Chen, Kang-Yin, Li, Yong-Jian, Choi, Byoung Geol, Choi, Se Yeon, Kim, Jin Won, Kim, Eung Ju, Park, Chang Gyu, Seo, Hong Seog, Oh, Dong Joo
Published in Journal of geriatric cardiology : JGC (01.10.2016)
Published in Journal of geriatric cardiology : JGC (01.10.2016)
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Journal Article