Modeling of Hot-Carrier Degradation in nLDMOS Devices: Different Approaches to the Solution of the Boltzmann Transport Equation
Sharma, Prateek, Tyaginov, Stanislav, Wimmer, Yannick, Rudolf, Florian, Rupp, Karl, Bina, Markus, Enichlmair, Hubert, Jong-Mun Park, Minixhofer, Rainer, Ceric, Hajdin, Grasser, Tibor
Published in IEEE transactions on electron devices (01.06.2015)
Published in IEEE transactions on electron devices (01.06.2015)
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Journal Article
The role of cold carriers and the multiple-carrier process of Si–H bond dissociation for hot-carrier degradation in n- and p-channel LDMOS devices
Sharma, Prateek, Tyaginov, Stanislav, Jech, Markus, Wimmer, Yannick, Rudolf, Florian, Enichlmair, Hubert, Park, Jong-Mun, Ceric, Hajdin, Grasser, Tibor
Published in Solid-state electronics (01.01.2016)
Published in Solid-state electronics (01.01.2016)
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Journal Article
Modeling of hot-carrier degradation in LDMOS devices using a drift-diffusion based approach
Sharma, Prateek, Jech, Markus, Tyaginov, Stanislav, Rudolf, Florian, Rupp, Karl, Enichlmair, Hubert, Jong-Mun Park, Grasser, Tibor
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)
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Conference Proceeding
Journal Article
Predictive and efficient modeling of hot-carrier degradation in nLDMOS devices
Sharma, Prateek, Tyaginov, Stanislav, Wimmer, Yannick, Rudolf, Florian, Rupp, Karl, Bina, Markus, Enichlmair, Hubert, Jong-Mun Park, Ceric, Hajdin, Grasser, Tibor
Published in 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2015)
Published in 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) (01.05.2015)
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Conference Proceeding
Subjectivity Analysis of Underground Incinerators: Focus on Academic and Industry Experts
Lee, Jae-hyuck, Shin, Kyung-hee, Park, Jong-mun, Kim, Choong-gon, Cho, Kong-jang
Published in Land (Basel) (01.11.2021)
Published in Land (Basel) (01.11.2021)
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Journal Article
Surgical Management of Atypical Vogt-Koyanagi-Harada Disease
Lim, Young Jin, Han, Yong Sup, Chung, In Young, Park, Jong Mun
Published in Daihan angwa haghoi jabji (2010)
Published in Daihan angwa haghoi jabji (2010)
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Journal Article
TCAD study of Single Photon Avalanche Diode on 0.35μm high voltage technology
Roger, Frederic, Teva, Jordi, Wachmann, Ewald, Jong Mun Park, Minixhofer, Rainer
Published in 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2013)
Published in 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2013)
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Conference Proceeding
Secondary generated holes as a crucial component for modeling of HC degradation in high-voltage n-MOSFET
Tyaginov, S., Starkov, I., Triebl, O., Ceric, H., Grasser, T., Enichlmair, H., Jong-Mun Park, Jungemann, C.
Published in 2011 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2011)
Published in 2011 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2011)
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Conference Proceeding
Hot-carrier behaviour and ron-BV trade-off optimization for p-channel LDMOS transistors in a 180 nm HV-CMOS technology
Jong Mun Park, Knaipp, M., Enichlmair, H., Minixhofer, R., Yun Shi, Feilchenfeld, N.
Published in 2012 24th International Symposium on Power Semiconductor Devices and ICs (01.06.2012)
Published in 2012 24th International Symposium on Power Semiconductor Devices and ICs (01.06.2012)
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Conference Proceeding
A model for hot-carrier degradation in nLDMOS transistors based on the exact solution of the Boltzmann transport equation versus the drift-diffusion scheme
Sharma, Prateek, Tyaginov, Stanislav, Wimmer, Yannick, Rudolf, Florian, Enichlmair, Hubert, Jong-Mun Park, Ceric, Hajdin, Grasser, Tibor
Published in EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (01.01.2015)
Published in EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (01.01.2015)
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Conference Proceeding