Search Results - "Park, Chuntaek" :: K.UTB vyhledávací portál

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Degradation of Off-Phase Leakage Current of FinFETs and Gate-All-Around FETs Induced by the Self-Heating Effect in the High-Frequency Operation Regime

by Park, Chuntaek, Yun, Ilgu
Published in IEEE transactions on nanotechnology (2020)

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Thermal modeling of 7 nm node bulk fin-shaped field-effect transistors for device structure-aware design

by Park, Chuntaek, Yun, Ilgu
Published in Semiconductor science and technology (15.10.2018)

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Journal Article

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Optimization of Self-Heating Driven Leakage Current Properties of Gate-All-Around Field-Effect Transistors Using Neural Network Modeling and Genetic Algorithm

by Park, Chuntaek, Yun, Ilgu
Published in Electronics (Basel) (01.11.2021)

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Journal Article

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Mechanical stress-induced degradation model of amorphous InGaZnO thin film transistors by strain-initiated defect generation

by Park, Chuntaek, Yun, Ilgu
Published in Microelectronics and reliability (01.09.2017)

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Journal Article

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Real-Time Plasma Uniformity Monitoring via Selective Plasma Light Intensity Measurement Using Transparent-LCD-Module-Adapted Optical Emission Spectroscopy

by Kim, In Joong, Park, Chuntaek, Shin, Dongseok, Yun, Ilgu
Published in IEEE sensors journal (15.01.2021)

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Journal Article

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Crack-guided effect on dynamic mechanical stress for foldable low temperature polycrystalline silicon thin film transistors

by Lee, Sang Myung, Park, Chuntaek, Yun, Ilgu
Published in Microelectronics and reliability (01.09.2016)

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Journal Article

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Effects of mechanical stresses on the reliability of low-temperature polycrystalline silicon thin film transistors for foldable displays

by Bae, Min Soo, Park, Chuntaek, Shin, Dongseok, Lee, Sang Myung, Yun, Ilgu
Published in Solid-state electronics (01.07.2017)

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Journal Article

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Universal core model for multiple-gate field-effect transistors with short channel and quantum mechanical effects

by Shin, Yong Hyeon, Bae, Min Soo, Park, Chuntaek, Park, Joung Won, Park, Hyunwoo, Lee, Yong Ju, Yun, Ilgu
Published in Semiconductor science and technology (01.06.2018)

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Journal Article

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Compact Drain Current Model of Nanoscale FinFET Considering Short Channel Effect in Ballistic Transport Regime

by Bae, Min Soo, Park, Chuntaek, Yun, Ilgu
Published in 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (01.07.2018)

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