Noise optimization of single-photon avalanche diodes fabricated in 110 nm CMOS image sensor technology
Ha, Won-Yong, Park, Eunsung, Park, Byungchoul, Chae, Youngcheol, Choi, Woo-Young, Lee, Myung-Jae
Published in Optics express (25.04.2022)
Published in Optics express (25.04.2022)
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Journal Article
A 640 [Formula Omitted] 640 Fully Dynamic CMOS Image Sensor for Always-On Operation
Park, Injun, Woojin Jo, Park, Chanmin, Park, Byungchoul, Cheon, Jimin, Chae, Youngcheol
Published in IEEE journal of solid-state circuits (01.04.2020)
Published in IEEE journal of solid-state circuits (01.04.2020)
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Journal Article
A 113.3-dB Dynamic Range 600 Frames/s SPAD X-Ray Detector With Seamless Global Shutter and Time-Encoded Extrapolation Counter
Park, Byungchoul, Choi, Hyun-Seung, Jeong, Jinwoong, Kim, Taewoo, Lee, Myung-Jae, Chae, Youngcheol
Published in IEEE journal of solid-state circuits (01.11.2023)
Published in IEEE journal of solid-state circuits (01.11.2023)
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Journal Article
A 640 \times 640 Fully Dynamic CMOS Image Sensor for Always-On Operation
Park, Injun, Jo, Woojin, Park, Chanmin, Park, Byungchoul, Cheon, Jimin, Chae, Youngcheol
Published in IEEE journal of solid-state circuits (01.04.2020)
Published in IEEE journal of solid-state circuits (01.04.2020)
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Journal Article
A 30fps \mathbf\times \mathbf CMOS Flash LiDAR Sensor with Push-Pull Analog Counter Achieving 0.1% Depth Uncertainty at 70m Detection Range
Cho, Dongseok, Park, Byungchoul, Choi, Hyun-Seung, Lee, Myung-Jae, Chae, Youngcheol
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
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Conference Proceeding
A 7.2inch 5.5Mpixel 600mW SPAD X-Ray Detector with 116.7 dB Dynamic Range
Park, Byungchoul, Choi, Hyun-Seung, Jeong, Jinwoong, Cheon, Jimin, Lee, Myung-Jae, Chae, Youngcheol
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
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Conference Proceeding
Structure variation effects on device reliability of single photon avalanche diodes
Shin, Dongseok, Park, Byungchoul, Chae, Youngcheol, Yun, Ilgu
Published in Microelectronics and reliability (01.09.2017)
Published in Microelectronics and reliability (01.09.2017)
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Journal Article
5.6 A 400 \times 200 600fps 117.7dB-DR SPAD X-Ray Detector with Seamless Global Shutter and Time-Encoded Extrapolation Counter
Park, Byungchoul, Ahn, Byungwook, Choi, Hyun-Seung, Jeong, Jinwoong, Hwang, Kangmin, Kim, Taewoo, Lee, Myung-Jae, Chae, Youngcheol
Published in 2023 IEEE International Solid- State Circuits Conference (ISSCC) (19.02.2023)
Published in 2023 IEEE International Solid- State Circuits Conference (ISSCC) (19.02.2023)
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Conference Proceeding
ANALOG-DIGITAL CONVERTER USING TIME STRETCHER AND IMAGE SENSOR HAVING THE SAME
CHAE YOUNGCHEOL, PARK INJUN, PARK CHANMIN, JO WOOJIN, PARK BYUNGCHOUL
Year of Publication 13.05.2020
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Year of Publication 13.05.2020
Patent
A 64×64 APD-Based ToF Image Sensor with Background Light Suppression up to 200 klx Using In-Pixel Auto-Zeroing and Chopping
Park, Byungchoul, Park, Injun, Choi, Woojun, Chae, Youngcheol
Published in 2019 Symposium on VLSI Circuits (01.06.2019)
Published in 2019 Symposium on VLSI Circuits (01.06.2019)
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Conference Proceeding
A 640×640 Fully Dynamic CMOS Image Sensor for Always-On Object Recognition
Park, Injun, Jo, Woojin, Park, Chanmin, Park, Byungchoul, Cheon, Jimin, Chae, Youngcheol
Published in 2019 Symposium on VLSI Circuits (01.06.2019)
Published in 2019 Symposium on VLSI Circuits (01.06.2019)
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Conference Proceeding