Michael Hatzakis, semiconductor industry pioneer
Paraszczak, J., Shaw, J.M., Kern, D.P., Argitis, P., Davazoglou, D., Raptis, I., Tsoukalas, D., Gogolides, E.
Published in Micro and Nano Engineering (01.09.2024)
Published in Micro and Nano Engineering (01.09.2024)
Get full text
Journal Article
Maximization of productivity of autonomous equipment in underground mines
Get full text
Journal Article
Trade Publication Article
Smarter Cities and Their Innovation Challenges
Naphade, M, Banavar, G, Harrison, C, Paraszczak, J, Morris, R
Published in Computer (Long Beach, Calif.) (01.06.2011)
Published in Computer (Long Beach, Calif.) (01.06.2011)
Get full text
Journal Article
3-D numerical modelling of radial- axial rock splitting
HADJIGEORGIOU, J, GHANMI, A, PARASZCZAK, J
Published in Geotechnical and geological engineering (01.03.1998)
Published in Geotechnical and geological engineering (01.03.1998)
Get full text
Journal Article
Instrumenting the planet
Chen-Ritzo, C.-H., Harrison, C., Paraszczak, J., Parr, F.
Published in IBM journal of research and development (01.01.2009)
Published in IBM journal of research and development (01.01.2009)
Get full text
Journal Article
Methods of creation and effect of microwave plasmas upon the etching of polymers and silicon
Paraszczak, J., Heidenreich, J., Hatzakis, M., Moisan, M.
Published in Microelectronic engineering (01.12.1985)
Published in Microelectronic engineering (01.12.1985)
Get full text
Journal Article
Comparison of vapor and liquid phase silylation processes of photoresists
Babich, E., Paraszczak, J., Gelorme, J., McGouey, R., Brady, M., Nunes, R., Smith, R.
Published in Microelectronic engineering (01.01.1991)
Published in Microelectronic engineering (01.01.1991)
Get full text
Journal Article
Silylation of resist materials using di- and polyfunctional organosilicon compounds
Babich, E., Paraszczak, J., Witman, D., McGouey, R., Hatzakis, M., Shaw, J., Chou, N.
Published in Microelectronic engineering (1990)
Published in Microelectronic engineering (1990)
Get full text
Journal Article
A simple bilayer lift-off process
Witman, David F., Shaw, Jane M., Hatzakis, Michael, Babich, Edward D., Paraszczak, Jurij R., Stewart, Kevin J.
Published in Microelectronic engineering (1990)
Published in Microelectronic engineering (1990)
Get full text
Journal Article
Conference Proceeding
Issues in data embedding and synchronization for digital television
Brunheroto, J., Chernock, R., Dettori, P., Dong, X., Paraszczak, J., Schaffa, F., Seidman, D.
Published in 2000 IEEE International Conference on Multimedia and Expo. ICME2000. Proceedings. Latest Advances in the Fast Changing World of Multimedia (Cat. No.00TH8532) (2000)
Published in 2000 IEEE International Conference on Multimedia and Expo. ICME2000. Proceedings. Latest Advances in the Fast Changing World of Multimedia (Cat. No.00TH8532) (2000)
Get full text
Conference Proceeding
ICEBE 2008 Keynote II
Paraszczak, J.
Published in 2008 IEEE International Conference on e-Business Engineering (01.10.2008)
Published in 2008 IEEE International Conference on e-Business Engineering (01.10.2008)
Get full text
Conference Proceeding
Adhesion test standardization for multichip module packages
Shih, D.-Y., Kim, J., Buchwalter, P., Lauro, P., Clearfield, H., Lee, K.-W., Paraszczak, J., Purushothaman, S., Viehbeck, A., Kamath, S., Lund, C., Tong, H.M., Anschel, M., Lacombe, R.
Published in 1995 Proceedings. 45th Electronic Components and Technology Conference (1995)
Published in 1995 Proceedings. 45th Electronic Components and Technology Conference (1995)
Get full text
Conference Proceeding
Journal Article
Factors affecting the interconnection resistance and yield in the fabrication of multilayer polyimide/metal thin film structures
Shih, D.-Y., Yeh, H., Narayan, C., Lewis, J., Graham, W., Nunes, S., Paraszczak, J., McGouey, R., Galligan, E., Cataldo, J., Serino, R., Perfecto, E., Chang, C.-A., Deutsch, A., Rothman, L., Ritsko, J., Wilczynski, J.
Published in 1992 Proceedings 42nd Electronic Components & Technology Conference (1992)
Published in 1992 Proceedings 42nd Electronic Components & Technology Conference (1992)
Get full text
Conference Proceeding
Factors affecting the interconnection resistance and yield in multilayer polyimide/copper structures
Shih, D.-Y., Yeh, H.L., Paraszczak, J., Lewis, J., Graham, W., Nunes, S., Narayan, C., McGouey, R., Galligan, E., Cataldo, J., Serino, R., Perfecto, E., Chang, C.-A., Deutsch, A., Rothman, L., Ritsko, J.J., Wilczynski, J.S.
Published in IEEE transactions on components, hybrids, and manufacturing technology (01.02.1993)
Published in IEEE transactions on components, hybrids, and manufacturing technology (01.02.1993)
Get full text
Journal Article
Conference Proceeding