A systematic reliability investigation of the dielectric charging process in electrostatically actuated MEMS based on Kelvin probe force microscopy
Zaghloul, U, Papaioannou, G J, Coccetti, F, Pons, P, Plana, R
Published in Journal of micromechanics and microengineering (01.06.2010)
Published in Journal of micromechanics and microengineering (01.06.2010)
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Conference Proceeding
Nanoscale characterization of different stiction mechanisms in electrostatically driven MEMS devices based on adhesion and friction measurements
Zaghloul, U., Bhushan, B., Pons, P., Papaioannou, G.J., Coccetti, F., Plana, R.
Published in Journal of colloid and interface science (01.06.2011)
Published in Journal of colloid and interface science (01.06.2011)
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Journal Article
Determination of bulk discharge current in the dielectric film of MEMS capacitive switches
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Journal Article
Conference Proceeding
Hydrogen passivation on Sequential Lateral Solidified poly-Si TFTs
Michalas, L., Koutsoureli, M., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.
Published in Microelectronic engineering (01.02.2012)
Published in Microelectronic engineering (01.02.2012)
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Conference Proceeding
Degradation of polycrystalline silicon TFTs due to alpha particles irradiation stress
Michalas, L., Papaioannou, G.J., Voutsas, A.T.
Published in Microelectronics and reliability (01.09.2010)
Published in Microelectronics and reliability (01.09.2010)
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Journal Article
Conference Proceeding
Back gate influence on front channel operation of p-channel double gate polysilicon TFTs
Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Voutsas, A.T.
Published in Thin solid films (01.10.2009)
Published in Thin solid films (01.10.2009)
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Conference Proceeding
On the study of p-channel thin-film transistors fabricated by SLS ELA crystallization techniques
Exarchos, M.A., Moschou, D.C., Papaioannou, G.J., Kouvatsos, D.N., Arapoyanni, A., Voutsas, A.T.
Published in Thin solid films (01.10.2009)
Published in Thin solid films (01.10.2009)
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Conference Proceeding
The effect of generation–recombination mechanisms on the transient behavior of polycrystalline silicon transistors
Papaioannou, G.J., Voutsas, A., Exarchos, M., Kouvatsos, D.
Published in Thin solid films (01.09.2005)
Published in Thin solid films (01.09.2005)
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Conference Proceeding
On the influence of environment gases, relative humidity and gas purification on dielectric charging/discharging processes in electrostatically driven MEMS/NEMS devices
Zaghloul, U, Bhushan, B, Pons, P, Papaioannou, G J, Coccetti, F, Plana, R
Published in Nanotechnology (21.01.2011)
Published in Nanotechnology (21.01.2011)
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A novel SLS ELA crystallization process and its effects on polysilicon film defectivity and TFT performance
Moschou, Despina C., Exarchos, M.A., Kouvatsos, D.N., Papaioannou, G.J., Voutsas, A.T.
Published in Microelectronic engineering (01.05.2008)
Published in Microelectronic engineering (01.05.2008)
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Conference Proceeding
Characterization of thin film transistors fabricated on different sequential lateral solidified poly-silicon substrates
Michalas, L., Papaioannou, G.J., Kouvatsos, D.N., Farmakis, F.V., Voutsas, A.T.
Published in Microelectronic engineering (01.05.2008)
Published in Microelectronic engineering (01.05.2008)
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Journal Article
Conference Proceeding
Nanoscale characterization of the dielectric charging phenomenon in PECVD silicon nitride thin films with various interfacial structures based on Kelvin probe force microscopy
Zaghloul, U, Papaioannou, G J, Wang, H, Bhushan, B, Coccetti, F, Pons, P, Plana, R
Published in Nanotechnology (20.05.2011)
Published in Nanotechnology (20.05.2011)
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Journal Article
RF MEMS sensitivity to electromagnetic radiation
Theonas, V G, Exarchos, M, Konstantinidis, G, Papaioannou, G J
Published in Journal of physics. Conference series (01.01.2005)
Published in Journal of physics. Conference series (01.01.2005)
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Journal Article
A temperature study of photosensitivity in SLS polycrystalline silicon TFTs
Michalas, L., Syntychaki, A., Koutsoureli, M., Papaioannou, G.J., Voutsas, A.T.
Published in Microelectronics and reliability (01.09.2012)
Published in Microelectronics and reliability (01.09.2012)
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Journal Article
Conference Proceeding
The impact of static and dynamic degradation on SOI “smart-cut” floating body MOSFETs
Exarchos, M.A., Papaioannou, G.J., Jomaah, J., Balestra, F.
Published in Microelectronics and reliability (01.09.2005)
Published in Microelectronics and reliability (01.09.2005)
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Journal Article
Conference Proceeding
Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors
KOUVATSOS, D. N, DAVIDOVIC, V, PAPAIOANNOU, G. J, STOJADINOVIC, N, MICHALAS, L, EXARCHOS, M, VOUTSAS, A. T, GOUSTOURIDIS, D
Published in Microelectronics and reliability (01.09.2004)
Published in Microelectronics and reliability (01.09.2004)
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Conference Proceeding
ESD failure signature in capacitive RF MEMS switches
Ruan, J., Papaioannou, G.J., Nolhier, N., Mauran, N., Bafleur, M., Coccetti, F., Plana, R.
Published in Microelectronics and reliability (01.08.2008)
Published in Microelectronics and reliability (01.08.2008)
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Conference Proceeding
Investigation of drain current transient behavior in SLS TFTs with the DLTS technique
Exarchos, M A, Papaioannou, G J, Kouvatsos, D N, Voutsas, A T
Published in Journal of physics. Conference series (01.01.2005)
Published in Journal of physics. Conference series (01.01.2005)
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Journal Article